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Structural, syntactic, and statistic...

Krzyzak, Adam.

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Structural, syntactic, and statistical pattern recognition = joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022 : proceedings /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Structural, syntactic, and statistical pattern recognition/ edited by Adam Krzyzak ... [et al.].
Reminder of title:	joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022 : proceedings /
remainder title:	S+SSPR 2022
other author:	Krzyzak, Adam.
corporate name:	International Workshop on Structural and Syntactic Pattern Recognition
Published:	Cham :Springer International Publishing : : 2022.,
Description:	xiii, 324 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer Nature eBook
Subject:	Pattern recognition systems - Congresses. -
Online resource:	https://doi.org/10.1007/978-3-031-23028-8
ISBN:	9783031230288

Structural, syntactic, and statistical pattern recognition = joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022 : proceedings /
Structural, syntactic, and statistical pattern recognitionjoint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022 : proceedings /[electronic resource] :S+SSPR 2022edited by Adam Krzyzak ... [et al.]. - Cham :Springer International Publishing :2022. - xiii, 324 p. :ill. (some col.), digital ;24 cm. - Lecture notes in computer science,138130302-9743 ;. - Lecture notes in computer science ;13813..

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022. The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions. The workshops presents papers on topics such as deep learning, processing, computer vision, machine learning and pattern recognition and much more.

ISBN: 9783031230288

Standard No.: 10.1007/978-3-031-23028-8doiSubjects--Topical Terms:

563039
Pattern recognition systems
--Congresses.

LC Class. No.: TK7882.P3

Dewey Class. No.: 006.4

Structural, syntactic, and statistical pattern recognition = joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022 : proceedings /
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