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Vlsi design and test = 26th Internat...
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VDAT (Symposium) (2022 :)
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Vlsi design and test = 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Vlsi design and test/ edited by Ambika Prasad Shah ... [et al.].
Reminder of title:
26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
remainder title:
VDAT 2022
other author:
Shah, Ambika Prasad.
corporate name:
VDAT (Symposium)
Published:
Cham :Springer Nature Switzerland : : 2022.,
Description:
xviii, 596 p. :ill. (some col.), digital ;24 cm.
Contained By:
Springer Nature eBook
Subject:
Integrated circuits - Very large scale integration -
Online resource:
https://doi.org/10.1007/978-3-031-21514-8
ISBN:
9783031215148
Vlsi design and test = 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
Vlsi design and test
26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /[electronic resource] :VDAT 2022edited by Ambika Prasad Shah ... [et al.]. - Cham :Springer Nature Switzerland :2022. - xviii, 596 p. :ill. (some col.), digital ;24 cm. - Communications in computer and information science,16871865-0937 ;. - Communications in computer and information science ;1687..
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
ISBN: 9783031215148
Standard No.: 10.1007/978-3-031-21514-8doiSubjects--Topical Terms:
699885
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75
Dewey Class. No.: 621.395
Vlsi design and test = 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
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This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
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Computer Science (SpringerNature-11645)
based on 0 review(s)
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電子資源
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W9447723
電子資源
11.線上閱覽_V
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EB TK7874.75
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