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Thermal reliability of power semicon...

Du, Xiong.

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Thermal reliability of power semiconductor device in the renewable energy system

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Thermal reliability of power semiconductor device in the renewable energy system/ by Xiong Du ... [et al.].
作者:	Du, Xiong.
出版者:	Singapore :Springer Nature Singapore : : 2022.,
面頁冊數:	xvi, 172 p. :ill. (some col.), digital ;24 cm.
內容註:	Introduction -- Thermal fatigue failure mechanism of power devices in renewable energy system -- Thermal model and thermal parameters monitoring -- Thermal analysis of power semiconductor device in renewable energy system -- Multi-time scale lifetime evaluation for the device in the renewable application -- Thermal management design and optimization -- Prospect.
Contained By:	Springer Nature eBook
標題:	Power semiconductors. -
電子資源:	https://doi.org/10.1007/978-981-19-3132-1
ISBN:	9789811931321

Thermal reliability of power semiconductor device in the renewable energy system
Du, Xiong.

Thermal reliability of power semiconductor device in the renewable energy system[electronic resource] /by Xiong Du ... [et al.]. - Singapore :Springer Nature Singapore :2022. - xvi, 172 p. :ill. (some col.), digital ;24 cm. - CPSS power electronics series,2520-8861. - CPSS power electronics series..

Introduction -- Thermal fatigue failure mechanism of power devices in renewable energy system -- Thermal model and thermal parameters monitoring -- Thermal analysis of power semiconductor device in renewable energy system -- Multi-time scale lifetime evaluation for the device in the renewable application -- Thermal management design and optimization -- Prospect.

This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.

ISBN: 9789811931321

Standard No.: 10.1007/978-981-19-3132-1doiSubjects--Topical Terms:

1047981
Power semiconductors.

LC Class. No.: TK7871.85

Dewey Class. No.: 621.38152

Thermal reliability of power semiconductor device in the renewable energy system
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