東華大學圖書館 |

Language: English

Help

回圖書館首頁

手機版館藏查詢

Back

Switch To: Labeled | MARC Mode | ISBD

Reliability of organic compounds in ...

Driel, Willem Dirk van.

Linked to FindBook

Google Book

Amazon

博客來

Reliability of organic compounds in microelectronics and optoelectronics = from physics-of-failure to physics-of-degradation /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Reliability of organic compounds in microelectronics and optoelectronics/ edited by Willem Dirk van Driel, Maryam Yazdan Mehr.
Reminder of title:	from physics-of-failure to physics-of-degradation /
other author:	Driel, Willem Dirk van.
Published:	Cham :Springer International Publishing : : 2022.,
Description:	viii, 550 p. :ill. (chiefly col.), digital ;24 cm.
[NT 15003449]:	Introduction to reliability -- Introduction to failure analysis methodologies -- An overview of remaining life assessment methodologies in engineering materials -- Reliability and failure of microelectronic materials and components in harsh working conditions -- Reliability and failure of solar cell materials and systems in harsh working conditions -- Electromigration-induced failures in microelectronic components -- Corrosion and degradation of metals -- Creep failures in high temperature alloys -- An overview of failures in boilers and heat exchangers in power plants -- Fatigue-related failures -- Degradation and failure of polymers -- Virtual prototyping techniques for prediction material degradation -- Health monitoring, machine learning and digital twin -- Discussions and concluding remarks -- Index.
Contained By:	Springer Nature eBook
Subject:	Microelectronics - Materials. -
Online resource:	https://doi.org/10.1007/978-3-030-81576-9
ISBN:	9783030815769

Reliability of organic compounds in microelectronics and optoelectronics = from physics-of-failure to physics-of-degradation /
Reliability of organic compounds in microelectronics and optoelectronicsfrom physics-of-failure to physics-of-degradation /[electronic resource] :edited by Willem Dirk van Driel, Maryam Yazdan Mehr. - Cham :Springer International Publishing :2022. - viii, 550 p. :ill. (chiefly col.), digital ;24 cm.

Introduction to reliability -- Introduction to failure analysis methodologies -- An overview of remaining life assessment methodologies in engineering materials -- Reliability and failure of microelectronic materials and components in harsh working conditions -- Reliability and failure of solar cell materials and systems in harsh working conditions -- Electromigration-induced failures in microelectronic components -- Corrosion and degradation of metals -- Creep failures in high temperature alloys -- An overview of failures in boilers and heat exchangers in power plants -- Fatigue-related failures -- Degradation and failure of polymers -- Virtual prototyping techniques for prediction material degradation -- Health monitoring, machine learning and digital twin -- Discussions and concluding remarks -- Index.

This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors.

ISBN: 9783030815769

Standard No.: 10.1007/978-3-030-81576-9doiSubjects--Topical Terms:

656983
Microelectronics
--Materials.

LC Class. No.: TK7871 / .R45 2022

Dewey Class. No.: 621.3815

Reliability of organic compounds in microelectronics and optoelectronics = from physics-of-failure to physics-of-degradation /
LDR:03359nmm a2200325 a 4500 001 2297356
003 DE-He213
005 20220131220106.0
006 m d
007 cr nn 008maaau
008 230324s2022 sz s 0 eng d
020 $a 9783030815769 $q (electronic bk.)
020 $a 9783030815752 $q (paper)
024 7 $a 10.1007/978-3-030-81576-9 $2 doi
035 $a 978-3-030-81576-9
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7871 $b .R45 2022
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
090 $a TK7871 $b .R382 2022
245 0 0 $a Reliability of organic compounds in microelectronics and optoelectronics $h [electronic resource] : $b from physics-of-failure to physics-of-degradation / $c edited by Willem Dirk van Driel, Maryam Yazdan Mehr.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2022.
300 $a viii, 550 p. : $b ill. (chiefly col.), digital ; $c 24 cm.
505 0 $a Introduction to reliability -- Introduction to failure analysis methodologies -- An overview of remaining life assessment methodologies in engineering materials -- Reliability and failure of microelectronic materials and components in harsh working conditions -- Reliability and failure of solar cell materials and systems in harsh working conditions -- Electromigration-induced failures in microelectronic components -- Corrosion and degradation of metals -- Creep failures in high temperature alloys -- An overview of failures in boilers and heat exchangers in power plants -- Fatigue-related failures -- Degradation and failure of polymers -- Virtual prototyping techniques for prediction material degradation -- Health monitoring, machine learning and digital twin -- Discussions and concluding remarks -- Index.
520 $a This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors.
650 0 $a Microelectronics $x Materials. $3 656983
650 0 $a Optoelectronics $x Materials. $3 576099
650 0 $a Functional organic materials $x Deterioration. $3 3592832
650 0 $a Functional organic materials $x Fatigue. $3 3592833
650 1 4 $a Electronic Circuits and Systems. $3 3538814
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 893838
650 2 4 $a Electronic Devices. $3 3538495
700 1 $a Driel, Willem Dirk van. $3 3295453
700 1 $a Yazdan Mehr, Maryam. $3 3592831
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-030-81576-9
950 $a Engineering (SpringerNature-11647)