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Reliability of organic compounds in ...

Driel, Willem Dirk van.

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Reliability of organic compounds in microelectronics and optoelectronics = from physics-of-failure to physics-of-degradation /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Reliability of organic compounds in microelectronics and optoelectronics/ edited by Willem Dirk van Driel, Maryam Yazdan Mehr.
其他題名:	from physics-of-failure to physics-of-degradation /
其他作者:	Driel, Willem Dirk van.
出版者:	Cham :Springer International Publishing : : 2022.,
面頁冊數:	viii, 550 p. :ill. (chiefly col.), digital ;24 cm.
內容註:	Introduction to reliability -- Introduction to failure analysis methodologies -- An overview of remaining life assessment methodologies in engineering materials -- Reliability and failure of microelectronic materials and components in harsh working conditions -- Reliability and failure of solar cell materials and systems in harsh working conditions -- Electromigration-induced failures in microelectronic components -- Corrosion and degradation of metals -- Creep failures in high temperature alloys -- An overview of failures in boilers and heat exchangers in power plants -- Fatigue-related failures -- Degradation and failure of polymers -- Virtual prototyping techniques for prediction material degradation -- Health monitoring, machine learning and digital twin -- Discussions and concluding remarks -- Index.
Contained By:	Springer Nature eBook
標題:	Microelectronics - Materials. -
電子資源:	https://doi.org/10.1007/978-3-030-81576-9
ISBN:	9783030815769

Reliability of organic compounds in microelectronics and optoelectronics = from physics-of-failure to physics-of-degradation /
Reliability of organic compounds in microelectronics and optoelectronicsfrom physics-of-failure to physics-of-degradation /[electronic resource] :edited by Willem Dirk van Driel, Maryam Yazdan Mehr. - Cham :Springer International Publishing :2022. - viii, 550 p. :ill. (chiefly col.), digital ;24 cm.

Introduction to reliability -- Introduction to failure analysis methodologies -- An overview of remaining life assessment methodologies in engineering materials -- Reliability and failure of microelectronic materials and components in harsh working conditions -- Reliability and failure of solar cell materials and systems in harsh working conditions -- Electromigration-induced failures in microelectronic components -- Corrosion and degradation of metals -- Creep failures in high temperature alloys -- An overview of failures in boilers and heat exchangers in power plants -- Fatigue-related failures -- Degradation and failure of polymers -- Virtual prototyping techniques for prediction material degradation -- Health monitoring, machine learning and digital twin -- Discussions and concluding remarks -- Index.

This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors.

ISBN: 9783030815769

Standard No.: 10.1007/978-3-030-81576-9doiSubjects--Topical Terms:

656983
Microelectronics
--Materials.

LC Class. No.: TK7871 / .R45 2022

Dewey Class. No.: 621.3815

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520 $a This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors.
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