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The microstructures of organic thin ...
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Yuan, Quan.
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The microstructures of organic thin films for transistor applications.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
The microstructures of organic thin films for transistor applications./
作者:
Yuan, Quan.
出版者:
Ann Arbor : ProQuest Dissertations & Theses, : 2008,
面頁冊數:
147 p.
附註:
Source: Dissertations Abstracts International, Volume: 70-04, Section: B.
Contained By:
Dissertations Abstracts International70-04B.
標題:
Materials science. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3313693
ISBN:
9780549622802
The microstructures of organic thin films for transistor applications.
Yuan, Quan.
The microstructures of organic thin films for transistor applications.
- Ann Arbor : ProQuest Dissertations & Theses, 2008 - 147 p.
Source: Dissertations Abstracts International, Volume: 70-04, Section: B.
Thesis (Ph.D.)--Stanford University, 2008.
This item must not be sold to any third party vendors.
Organic semiconductors with conjugated π-electron systems show great potential for low-cost, large-area electronic applications. Remarkable progress has been achieved in this field in the last two decades. Broader acceptance of organic semiconductors in electronic applications requires development of new materials with high charge carrier mobility and chemical stability in environmental conditions. A smart material design relies on a thorough understanding of the materials structure and property relationship. The organic thin film transistor (OTFT) is the core of many electronic applications. This thesis work is focused on understanding the correlation between microstructures and electronic properties for vacuum deposited oligomer thin films for transistor applications. Most previous structural characterizations were performed on bulk crystals, and the obtained bulk structures were correlated with thin film charge transport properties. However, charge transportation in OTFT mainly takes place in the first few monolayers near the dielectric/semiconductor interface. The microstructures of thin films near the channel region may be significantly different from bulk crystal structures. For example, in pentacene thin films the film structure is known to be significantly different from its bulk structure. In order to directly correlate molecular packing with thin film charge transport properties, it is crucial to obtain the detailed structure of the organic semiconductor in the thin films in contact with the dielectric surface. In this work, we selected aromatic cores which have already demonstrated high OTFT performance, and systematically introduced changes to the molecular structure. We studied changes in OTFT thin film microstructures and charge transport properties. In order to learn the detailed structure for ultrathin films (a few nanometers) relevant to OTFT devices, highly sensitive thin film characterization techniques, such as grazing incidence X-ray diffraction (GIXD) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy were used. The microstructure evolution during the thin film growth and under different process conditions was characterized. Theoretical models were used to calculate the precise molecular packing in organic thin films. We gained understanding of the impact of thin film microstructures on the charge mobility from different aspects. This study will provide feedbacks to new materials design to further improve their charge transport properties.
ISBN: 9780549622802Subjects--Topical Terms:
543314
Materials science.
Subjects--Index Terms:
Oligomers
The microstructures of organic thin films for transistor applications.
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Organic semiconductors with conjugated π-electron systems show great potential for low-cost, large-area electronic applications. Remarkable progress has been achieved in this field in the last two decades. Broader acceptance of organic semiconductors in electronic applications requires development of new materials with high charge carrier mobility and chemical stability in environmental conditions. A smart material design relies on a thorough understanding of the materials structure and property relationship. The organic thin film transistor (OTFT) is the core of many electronic applications. This thesis work is focused on understanding the correlation between microstructures and electronic properties for vacuum deposited oligomer thin films for transistor applications. Most previous structural characterizations were performed on bulk crystals, and the obtained bulk structures were correlated with thin film charge transport properties. However, charge transportation in OTFT mainly takes place in the first few monolayers near the dielectric/semiconductor interface. The microstructures of thin films near the channel region may be significantly different from bulk crystal structures. For example, in pentacene thin films the film structure is known to be significantly different from its bulk structure. In order to directly correlate molecular packing with thin film charge transport properties, it is crucial to obtain the detailed structure of the organic semiconductor in the thin films in contact with the dielectric surface. In this work, we selected aromatic cores which have already demonstrated high OTFT performance, and systematically introduced changes to the molecular structure. We studied changes in OTFT thin film microstructures and charge transport properties. In order to learn the detailed structure for ultrathin films (a few nanometers) relevant to OTFT devices, highly sensitive thin film characterization techniques, such as grazing incidence X-ray diffraction (GIXD) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy were used. The microstructure evolution during the thin film growth and under different process conditions was characterized. Theoretical models were used to calculate the precise molecular packing in organic thin films. We gained understanding of the impact of thin film microstructures on the charge mobility from different aspects. This study will provide feedbacks to new materials design to further improve their charge transport properties.
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