Formal methods for industrial critic...
International Workshop on Formal Methods for Industrial Critical Systems (2021 :)

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  • Formal methods for industrial critical systems = 26th International Conference, FMICS 2021, Paris, France, August 24-26, 2021 : proceedings /
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Formal methods for industrial critical systems/ edited by Alberto Lluch Lafuente, Anastasia Mavridou.
    Reminder of title: 26th International Conference, FMICS 2021, Paris, France, August 24-26, 2021 : proceedings /
    remainder title: FMICS 2021
    other author: Lluch Lafuente, Alberto.
    corporate name: International Workshop on Formal Methods for Industrial Critical Systems
    Published: Cham :Springer International Publishing : : 2021.,
    Description: xii, 249 p. :ill., digital ;24 cm.
    [NT 15003449]: Verification -- Verification of Co-Simulation Algorithms Subject to Algebraic Loops and Adaptive Steps -- Automated Verification of Temporal Properties of Ladder Programs -- Spatial Model Checking for Smart Stations: Research Challenges -- Program Safety and Education -- Parametric Faults in Safety Critical Programs -- Modular Transformation of Java Exceptions Modulo Errors -- On education and training in formal methods for industrial critical systems -- (Event-)B Modeling and Validation -- Improving SMT Solver Integrations for the Validation of B and Event-B Models -- Standard Conformance-by-Construction with Event-B -- Formal Analysis -- Randomized Reachability Analysis in Uppaal: Fast Error Detection in Timed Systems -- Verifying the Mathematical Library of an UAV Autopilot with Frama-C -- Formal Analysis of the UNISIG Safety Application Intermediate Sub-Layer -- Tools -- ProB2-UI: A Java-based User Interface for ProB -- Intrepid: a Scriptable and Cloud-ready SMT-based Model Checker -- Merit and Blame Assignment with Kind 2 -- Test Generation and Probabilistic Verification -- PSY-TaLiRo: A Python Toolbox for Search-Based Test Generation for Cyber-Physical Systems -- Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System.
    Contained By: Springer Nature eBook
    Subject: Formal methods (Computer science) - Congresses. -
    Online resource: https://doi.org/10.1007/978-3-030-85248-1
    ISBN: 9783030852481
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