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Scanning probe microscopy = the lab ...

Meyer, Ernst.

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Scanning probe microscopy = the lab on a tip /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Scanning probe microscopy/ by Ernst Meyer, Roland Bennewitz, Hans J. Hug.
其他題名:	the lab on a tip /
作者:	Meyer, Ernst.
其他作者:	Bennewitz, Roland.
出版者:	Cham :Springer International Publishing : : 2021.,
面頁冊數:	xiv, 322 p. :ill., digital ;24 cm.
內容註:	Introduction to Scanning Probe Microscopy -- Overview -- Basic Concepts -- Introduction to Scanning Tunneling Microscopy -- Tunneling: A Quantum-Mechanical Effect -- Instrumental Aspects -- Resolution Limits -- Observation of Confined Electrons -- Spin-Polarized Tunneling -- Observation of the Kondo Effect and Quantum Mirage -- Force Microscopy -- Concept and Instrumental Aspects -- Relevant Forces -- Operation Modes in Force Microscopy -- Contact Force Microscopy -- Dynamic Force Microscopy -- Tapping Mode Force Microscopy -- Further Modes of Force Microscopy -- Force Resolution and Thermal Noise -- High-speed AFM -- Multifrequency AFM -- MFM and Related Techniques -- MFM Operation Modes -- Contrast Formation -- Magnetic Resonance Force Microscopy -- Other Members of the SPM Family -- Artifacts in SPM -- Future Aspects of SPM.
Contained By:	Springer Nature eBook
標題:	Scanning probe microscopy. -
電子資源:	https://doi.org/10.1007/978-3-030-37089-3
ISBN:	9783030370893

Scanning probe microscopy = the lab on a tip /
Meyer, Ernst.

Scanning probe microscopythe lab on a tip /[electronic resource] :by Ernst Meyer, Roland Bennewitz, Hans J. Hug. - Second edition. - Cham :Springer International Publishing :2021. - xiv, 322 p. :ill., digital ;24 cm. - Graduate texts in physics,1868-4513. - Graduate texts in physics..

Introduction to Scanning Probe Microscopy -- Overview -- Basic Concepts -- Introduction to Scanning Tunneling Microscopy -- Tunneling: A Quantum-Mechanical Effect -- Instrumental Aspects -- Resolution Limits -- Observation of Confined Electrons -- Spin-Polarized Tunneling -- Observation of the Kondo Effect and Quantum Mirage -- Force Microscopy -- Concept and Instrumental Aspects -- Relevant Forces -- Operation Modes in Force Microscopy -- Contact Force Microscopy -- Dynamic Force Microscopy -- Tapping Mode Force Microscopy -- Further Modes of Force Microscopy -- Force Resolution and Thermal Noise -- High-speed AFM -- Multifrequency AFM -- MFM and Related Techniques -- MFM Operation Modes -- Contrast Formation -- Magnetic Resonance Force Microscopy -- Other Members of the SPM Family -- Artifacts in SPM -- Future Aspects of SPM.

Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, and tip-enhanced Raman scattering. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.

ISBN: 9783030370893

Standard No.: 10.1007/978-3-030-37089-3doiSubjects--Topical Terms:

603213
Scanning probe microscopy.

LC Class. No.: QH212.S33 / M49 2021

Dewey Class. No.: 502.825

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520 $a Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, and tip-enhanced Raman scattering. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.
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