Reliability, robustness and failure ...
Deshayes, Yannick,

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  • Reliability, robustness and failure mechanisms of LED devices = methodology and evaluation /
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Reliability, robustness and failure mechanisms of LED devices/ Yannick Deshayes, Laurent Béchou.
    Reminder of title: methodology and evaluation /
    Author: Deshayes, Yannick,
    other author: Béchou, Laurent,
    Published: London :ISTE Press, Ltd. ; : 2016.,
    Description: 1 online resource (174 p.).
    [NT 15003449]: Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures.
    [NT 15003449]: 3.4. Physics of failures3.5. Conclusion; Chapter 4. Methodologies of Reliability Analysis; 4.1. Introduction; 4.2. Method based on the physics of failures; 4.3. Digital methods; 4.4. A new approach; 4.5. Conclusion; Bibliography; Index; Back Cover.
    Subject: Light emitting diodes. -
    Online resource: https://www.sciencedirect.com/science/book/9781785481529
    ISBN: 9780081010884 (electronic bk.)
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