東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

On-chip current sensors for reliable...

Bastos, Rodrigo Possamai.

FindBook

Google Book

Amazon

博客來

On-chip current sensors for reliable, secure, and low-power integrated circuits

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	On-chip current sensors for reliable, secure, and low-power integrated circuits/ by Rodrigo Possamai Bastos, Frank Sill Torres.
作者:	Bastos, Rodrigo Possamai.
其他作者:	Torres, Frank Sill.
出版者:	Cham :Springer International Publishing : : 2020.,
面頁冊數:	xxxii, 162 p. :ill., digital ;24 cm.
內容註:	Chapter 1. Effects of transient faults in integrated circuits -- Chapter 2. Effectiveness of hardware-level techniques in detecting transient faults -- Chapter 3. Architectures of body built-in current sensors for detection of transient faults -- Chapter 4. Enhancing the design of body built-in sensor architectures -- Chapter 5. Noise robustness of body built-in sensors -- Chapter 6. Body built-in cells for detecting transient faults and adaptively biasing subcircuits -- Chapter 7. Automatic integration of body built-in sensors into digital design flows -- Chapter 8. Body built-in sensors for testing integrated circuit systems for hardware Trojans.
Contained By:	Springer eBooks
標題:	Integrated circuits - Design and construction. -
電子資源:	https://doi.org/10.1007/978-3-030-29353-6
ISBN:	9783030293536

On-chip current sensors for reliable, secure, and low-power integrated circuits
Bastos, Rodrigo Possamai.

On-chip current sensors for reliable, secure, and low-power integrated circuits[electronic resource] /by Rodrigo Possamai Bastos, Frank Sill Torres. - Cham :Springer International Publishing :2020. - xxxii, 162 p. :ill., digital ;24 cm.

Chapter 1. Effects of transient faults in integrated circuits -- Chapter 2. Effectiveness of hardware-level techniques in detecting transient faults -- Chapter 3. Architectures of body built-in current sensors for detection of transient faults -- Chapter 4. Enhancing the design of body built-in sensor architectures -- Chapter 5. Noise robustness of body built-in sensors -- Chapter 6. Body built-in cells for detecting transient faults and adaptively biasing subcircuits -- Chapter 7. Automatic integration of body built-in sensors into digital design flows -- Chapter 8. Body built-in sensors for testing integrated circuit systems for hardware Trojans.

This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs. Presents a unique approach for detection of radiation-induced transient faults in integrated circuits; Describes the effects of ionizing particles in the transistor body and discusses its exploitation; Includes innovative presentation of the multiple roles of body built-in sensors for reliability, security, and low-power applications.

ISBN: 9783030293536

Standard No.: 10.1007/978-3-030-29353-6doiSubjects--Topical Terms:

658490
Integrated circuits
--Design and construction.

LC Class. No.: TK7874

Dewey Class. No.: 621.3815

On-chip current sensors for reliable, secure, and low-power integrated circuits
LDR:02763nmm a2200325 a 4500 001 2213898
003 DE-He213
005 20200224112238.0
006 m d
007 cr nn 008maaau
008 201118s2020 sz s 0 eng d
020 $a 9783030293536 $q (electronic bk.)
020 $a 9783030293529 $q (paper)
024 7 $a 10.1007/978-3-030-29353-6 $2 doi
035 $a 978-3-030-29353-6
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7874
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
090 $a TK7874 $b .B327 2020
100 1 $a Bastos, Rodrigo Possamai. $3 3443874
245 1 0 $a On-chip current sensors for reliable, secure, and low-power integrated circuits $h [electronic resource] / $c by Rodrigo Possamai Bastos, Frank Sill Torres.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2020.
300 $a xxxii, 162 p. : $b ill., digital ; $c 24 cm.
505 0 $a Chapter 1. Effects of transient faults in integrated circuits -- Chapter 2. Effectiveness of hardware-level techniques in detecting transient faults -- Chapter 3. Architectures of body built-in current sensors for detection of transient faults -- Chapter 4. Enhancing the design of body built-in sensor architectures -- Chapter 5. Noise robustness of body built-in sensors -- Chapter 6. Body built-in cells for detecting transient faults and adaptively biasing subcircuits -- Chapter 7. Automatic integration of body built-in sensors into digital design flows -- Chapter 8. Body built-in sensors for testing integrated circuit systems for hardware Trojans.
520 $a This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs. Presents a unique approach for detection of radiation-induced transient faults in integrated circuits; Describes the effects of ionizing particles in the transistor body and discusses its exploitation; Includes innovative presentation of the multiple roles of body built-in sensors for reliability, security, and low-power applications.
650 0 $a Integrated circuits $x Design and construction. $3 658490
650 0 $a Systems on a chip. $3 729732
650 1 4 $a Circuits and Systems. $3 896527
650 2 4 $a Processor Architectures. $3 892680
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 893838
700 1 $a Torres, Frank Sill. $3 3443875
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u https://doi.org/10.1007/978-3-030-29353-6
950 $a Engineering (Springer-11647)