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Electromigration and Electrothermal ...

Sawtelle, Sonya D.

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Electromigration and Electrothermal Properties in Gold Nanostructures.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Electromigration and Electrothermal Properties in Gold Nanostructures./
Author:	Sawtelle, Sonya D.
Published:	Ann Arbor : ProQuest Dissertations & Theses, : 2018,
Description:	187 p.
Notes:	Source: Dissertations Abstracts International, Volume: 80-09, Section: B.
Contained By:	Dissertations Abstracts International80-09B.
Subject:	Applied physics. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=13849885
ISBN:	9780438970717

Electromigration and Electrothermal Properties in Gold Nanostructures.
Sawtelle, Sonya D.

Electromigration and Electrothermal Properties in Gold Nanostructures. - Ann Arbor : ProQuest Dissertations & Theses, 2018 - 187 p.

Source: Dissertations Abstracts International, Volume: 80-09, Section: B.

Thesis (Ph.D.)--Yale University, 2018.

This item must not be added to any third party search indexes.

As on-chip technologies continue to scale down across fields from electronics to biomedical devices, the relevance of metallic nanostructures under AC and DC current stress continues to grow. However, electrothermal phenomena and related material properties differ greatly from the micro to the nano scale, due to fundamental differences in the role of surfaces and interfaces, size effects in microstructure, and ultimately, at small enough length scales, quantum effects. This thesis seeks to improve understanding and modeling of electrothermal properties and the phenomenon of electromigration (EM) in ultra-thin, top-down patterned metal nanostructures. We develop and apply an experimental technique to estimate values for thermal conductivity of both a metal nanowire and its insulating substrate by measuring the increase in resistance due to small amounts of self-heating. The thermal conductivity of our nanowires increases rapidly with temperature and width and has values well below that of bulk gold, which can be qualitatively explained by the dominance of structural scattering. The Lorenz ratio is relatively constant over temperature, but is significantly lower than would be predicted within conventional Weidemann-Franz theory, and exhibits some width dependence. Armed with measured values of electrothermal material properties, we investigate the behavior of nanowires and nanobowties under conventional DC EM. We present several experiments supporting the need for a more nuanced picture of nanoscale EM than that of a fixed critical junction temperature at which EM onset is achieved. Our data suggests that even for a fixed cross-sectional geometry the junction temperature for EM, Tc, appears to vary with environmental temperature, thermal resistance of immediately adjacent regions, and even the direction of the current flow in asymmetric structures. The final part of this thesis explores the relationship between temperature and electron wind force in EM by looking at power and current density at breakdown under a generalized AC bias (AC with a DC offset). The maximum and time-average of the squared current density (which dictate the temperature) both exhibit a minimum in DC offset (which dictates the wind force), which is explained by wind-force driven annealing of the wire. This hypothesis is supported by observations of changing device resistance prior to EM onset and by SEM inspection. The frequency dependence of pure AC EM breaking is also presented and interpreted in terms of the effectiveness of damage healing upon current reversal and the degree of wind force driven annealing. Additionally, we have for the first time implemented an algorithm for feedback controlled AC EM (FCACEM) which may prove more suitable for single molecule junction applications.

ISBN: 9780438970717Subjects--Topical Terms:

3343996
Applied physics.

Electromigration and Electrothermal Properties in Gold Nanostructures.
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300 $a 187 p.
500 $a Source: Dissertations Abstracts International, Volume: 80-09, Section: B.
500 $a Publisher info.: Dissertation/Thesis.
500 $a Advisor: Reed, Mark A.
502 $a Thesis (Ph.D.)--Yale University, 2018.
506 $a This item must not be added to any third party search indexes.
506 $a This item must not be sold to any third party vendors.
520 $a As on-chip technologies continue to scale down across fields from electronics to biomedical devices, the relevance of metallic nanostructures under AC and DC current stress continues to grow. However, electrothermal phenomena and related material properties differ greatly from the micro to the nano scale, due to fundamental differences in the role of surfaces and interfaces, size effects in microstructure, and ultimately, at small enough length scales, quantum effects. This thesis seeks to improve understanding and modeling of electrothermal properties and the phenomenon of electromigration (EM) in ultra-thin, top-down patterned metal nanostructures. We develop and apply an experimental technique to estimate values for thermal conductivity of both a metal nanowire and its insulating substrate by measuring the increase in resistance due to small amounts of self-heating. The thermal conductivity of our nanowires increases rapidly with temperature and width and has values well below that of bulk gold, which can be qualitatively explained by the dominance of structural scattering. The Lorenz ratio is relatively constant over temperature, but is significantly lower than would be predicted within conventional Weidemann-Franz theory, and exhibits some width dependence. Armed with measured values of electrothermal material properties, we investigate the behavior of nanowires and nanobowties under conventional DC EM. We present several experiments supporting the need for a more nuanced picture of nanoscale EM than that of a fixed critical junction temperature at which EM onset is achieved. Our data suggests that even for a fixed cross-sectional geometry the junction temperature for EM, Tc, appears to vary with environmental temperature, thermal resistance of immediately adjacent regions, and even the direction of the current flow in asymmetric structures. The final part of this thesis explores the relationship between temperature and electron wind force in EM by looking at power and current density at breakdown under a generalized AC bias (AC with a DC offset). The maximum and time-average of the squared current density (which dictate the temperature) both exhibit a minimum in DC offset (which dictates the wind force), which is explained by wind-force driven annealing of the wire. This hypothesis is supported by observations of changing device resistance prior to EM onset and by SEM inspection. The frequency dependence of pure AC EM breaking is also presented and interpreted in terms of the effectiveness of damage healing upon current reversal and the degree of wind force driven annealing. Additionally, we have for the first time implemented an algorithm for feedback controlled AC EM (FCACEM) which may prove more suitable for single molecule junction applications.
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