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Introduction to quantum metrology = ...
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Nawrocki, Waldemar.
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Introduction to quantum metrology = the revised SI system and quantum standards /
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Introduction to quantum metrology/ by Waldemar Nawrocki.
其他題名:
the revised SI system and quantum standards /
作者:
Nawrocki, Waldemar.
出版者:
Cham :Springer International Publishing : : 2019.,
面頁冊數:
xiv, 326 p. :ill. (some col.), digital ;24 cm.
內容註:
Preface -- Theoretical Background of Quantum Metrology -- Measurements, Standards and Systems of Units -- The Revised SI System of Units -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect and the Resistance Standard -- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures -- Single Electron Tunneling -- Atomic Clocks and Time Scales -- Standards and Measurements of Length -- Satellite Navigation Systems -- Scanning Probe Microscopes -- New Standards of Mass.
Contained By:
Springer eBooks
標題:
Physical measurements. -
電子資源:
https://doi.org/10.1007/978-3-030-19677-6
ISBN:
9783030196776
Introduction to quantum metrology = the revised SI system and quantum standards /
Nawrocki, Waldemar.
Introduction to quantum metrology
the revised SI system and quantum standards /[electronic resource] :by Waldemar Nawrocki. - 2nd ed. - Cham :Springer International Publishing :2019. - xiv, 326 p. :ill. (some col.), digital ;24 cm.
Preface -- Theoretical Background of Quantum Metrology -- Measurements, Standards and Systems of Units -- The Revised SI System of Units -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect and the Resistance Standard -- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures -- Single Electron Tunneling -- Atomic Clocks and Time Scales -- Standards and Measurements of Length -- Satellite Navigation Systems -- Scanning Probe Microscopes -- New Standards of Mass.
This book discusses the theory of quantum effects used in metrology, and presents the author's research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency. The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia. This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices - atomic clocks - serve wide population of users.
ISBN: 9783030196776
Standard No.: 10.1007/978-3-030-19677-6doiSubjects--Topical Terms:
540265
Physical measurements.
LC Class. No.: QC39 / .N397 2019
Dewey Class. No.: 530.8
Introduction to quantum metrology = the revised SI system and quantum standards /
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Preface -- Theoretical Background of Quantum Metrology -- Measurements, Standards and Systems of Units -- The Revised SI System of Units -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect and the Resistance Standard -- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures -- Single Electron Tunneling -- Atomic Clocks and Time Scales -- Standards and Measurements of Length -- Satellite Navigation Systems -- Scanning Probe Microscopes -- New Standards of Mass.
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