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Measurement techniques and practices...
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Abe, Masahiko.
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Measurement techniques and practices of colloid and interface phenomena
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Measurement techniques and practices of colloid and interface phenomena/ edited by Masahiko Abe.
其他作者:
Abe, Masahiko.
出版者:
Singapore :Springer Singapore : : 2019.,
面頁冊數:
x, 145 p. :ill., digital ;24 cm.
內容註:
1. Basics of Surface Chemistry -- 2. Static Surface Tension -- 3. Dynamic Surface Tension -- 4. Surface Pressure -- 5. Surface Viscosity -- 6. Interfacial Tension between Water and Oils -- 7. Quartz Crystal Microbalance with Dissipation monitoring (QCM-D) -- 8. Atomic Force Microscope (AFM) -- 9. Static Light Scattering (SLS) -- 10. Dynamic Light Scattering (DLS) -- 11. Solubilization by Micelle -- 12. Rheology -- 13. Freeze-Fracture Transmission Electron Microscopy -- 14. Cryo-Transmission Electron Microscopy -- 15. Zeta(ζ)-potential for Micelle and Microemulsion -- 16. Electron Microscopy Observation of Solid Particles -- 17. Gas Adsorption on Surface of Solid Materials -- 18. Contact Angle Measurement for Solid Surface -- 19. Quality and treatment of water for experiment.
Contained By:
Springer eBooks
標題:
Surfaces (Technology) - Analysis. -
電子資源:
https://doi.org/10.1007/978-981-13-5931-6
ISBN:
9789811359316
Measurement techniques and practices of colloid and interface phenomena
Measurement techniques and practices of colloid and interface phenomena
[electronic resource] /edited by Masahiko Abe. - Singapore :Springer Singapore :2019. - x, 145 p. :ill., digital ;24 cm.
1. Basics of Surface Chemistry -- 2. Static Surface Tension -- 3. Dynamic Surface Tension -- 4. Surface Pressure -- 5. Surface Viscosity -- 6. Interfacial Tension between Water and Oils -- 7. Quartz Crystal Microbalance with Dissipation monitoring (QCM-D) -- 8. Atomic Force Microscope (AFM) -- 9. Static Light Scattering (SLS) -- 10. Dynamic Light Scattering (DLS) -- 11. Solubilization by Micelle -- 12. Rheology -- 13. Freeze-Fracture Transmission Electron Microscopy -- 14. Cryo-Transmission Electron Microscopy -- 15. Zeta(ζ)-potential for Micelle and Microemulsion -- 16. Electron Microscopy Observation of Solid Particles -- 17. Gas Adsorption on Surface of Solid Materials -- 18. Contact Angle Measurement for Solid Surface -- 19. Quality and treatment of water for experiment.
This book is a manual of measurement of colloids and interfaces designed especially for new researchers who have just begun research on these topics. The book is written by active researchers in the field of colloids and interfacial chemistry, based on the practical experience of the authors. In each chapter, the key points of measurement, how to analyze data correctly, points to be careful about, and merits of a particular method are concisely explained from the point of view of the readers. Not only in industries such as cosmetics and pharmaceuticals but also in academic studies of nanotechnology, correct understanding of colloid and interface phenomena is vital because the properties of these items, however small, are affected by the nature of interfaces. This book will be particularly useful for researchers who are not yet fully confident of the measurement techniques that are clearly explained here.
ISBN: 9789811359316
Standard No.: 10.1007/978-981-13-5931-6doiSubjects--Topical Terms:
592671
Surfaces (Technology)
--Analysis.
LC Class. No.: TP156.S95 / M437 2019
Dewey Class. No.: 620.44
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This book is a manual of measurement of colloids and interfaces designed especially for new researchers who have just begun research on these topics. The book is written by active researchers in the field of colloids and interfacial chemistry, based on the practical experience of the authors. In each chapter, the key points of measurement, how to analyze data correctly, points to be careful about, and merits of a particular method are concisely explained from the point of view of the readers. Not only in industries such as cosmetics and pharmaceuticals but also in academic studies of nanotechnology, correct understanding of colloid and interface phenomena is vital because the properties of these items, however small, are affected by the nature of interfaces. This book will be particularly useful for researchers who are not yet fully confident of the measurement techniques that are clearly explained here.
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