VLSI design and test = 22nd Internat...
VDAT (Symposium) (2018 :)

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  • VLSI design and test = 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
  • Record Type: Electronic resources : Monograph/item
    Title/Author: VLSI design and test/ edited by S. Rajaram ... [et al.].
    Reminder of title: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
    remainder title: VDAT 2018
    other author: Rajaram, S.
    corporate name: VDAT (Symposium)
    Published: Singapore :Springer Singapore : : 2019.,
    Description: xviii, 722 p. :ill. (some col.), digital ;24 cm.
    [NT 15003449]: Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.
    Contained By: Springer eBooks
    Subject: Integrated circuits - Very large scale integration -
    Online resource: https://doi.org/10.1007/978-981-13-5950-7
    ISBN: 9789811359507
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