Optical characterization of thin sol...
Stenzel, Olaf.

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  • Optical characterization of thin solid films
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: Optical characterization of thin solid films/ edited by Olaf Stenzel, Miloslav Ohlidal.
    其他作者: Stenzel, Olaf.
    出版者: Cham :Springer International Publishing : : 2018.,
    面頁冊數: xxiv, 462 p. :ill., digital ;24 cm.
    內容註: Introduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.
    Contained By: Springer eBooks
    標題: Thin films - Optical properties. -
    電子資源: http://dx.doi.org/10.1007/978-3-319-75325-6
    ISBN: 9783319753256
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W9343892 電子資源 11.線上閱覽_V 電子書 EB QC176.84.O7 O685 2018 一般使用(Normal) 在架 0
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