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Optical characterization of thin sol...

Stenzel, Olaf.

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Optical characterization of thin solid films

Record Type:	Electronic resources : Monograph/item
Title/Author:	Optical characterization of thin solid films/ edited by Olaf Stenzel, Miloslav Ohlidal.
other author:	Stenzel, Olaf.
Published:	Cham :Springer International Publishing : : 2018.,
Description:	xxiv, 462 p. :ill., digital ;24 cm.
[NT 15003449]:	Introduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.
Contained By:	Springer eBooks
Subject:	Thin films - Optical properties. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-75325-6
ISBN:	9783319753256

Optical characterization of thin solid films
Optical characterization of thin solid films[electronic resource] /edited by Olaf Stenzel, Miloslav Ohlidal. - Cham :Springer International Publishing :2018. - xxiv, 462 p. :ill., digital ;24 cm. - Springer series in surface sciences,v.640931-5195 ;. - Springer series in surface sciences ;v.64..

Introduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

ISBN: 9783319753256

Standard No.: 10.1007/978-3-319-75325-6doiSubjects--Topical Terms:

718346
Thin films
--Optical properties.

LC Class. No.: QC176.84.O7 / O685 2018

Dewey Class. No.: 621.38152

Optical characterization of thin solid films
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245 0 0 $a Optical characterization of thin solid films $h [electronic resource] / $c edited by Olaf Stenzel, Miloslav Ohlidal.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2018.
300 $a xxiv, 462 p. : $b ill., digital ; $c 24 cm.
490 1 $a Springer series in surface sciences, $x 0931-5195 ; $v v.64
505 0 $a Introduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.
520 $a This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
650 0 $a Thin films $x Optical properties. $3 718346
650 1 4 $a Physics. $3 516296
650 2 4 $a Surface and Interface Science, Thin Films. $3 1244633
650 2 4 $a Optical and Electronic Materials. $3 891120
650 2 4 $a Spectroscopy and Microscopy. $3 1066375
650 2 4 $a Characterization and Evaluation of Materials. $3 890988
650 2 4 $a Surfaces and Interfaces, Thin Films. $3 892408
700 1 $a Stenzel, Olaf. $3 897906
700 1 $a Ohlidal, Miloslav. $3 3309310
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
830 0 $a Springer series in surface sciences ; $v v.64. $3 3309311
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