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Fabrication, Characterization and Si...
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Wang, Jinghui.
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Fabrication, Characterization and Simulation of Sandwich Structure GaN Schottky Diode Ionizing Radiation Detectors.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Fabrication, Characterization and Simulation of Sandwich Structure GaN Schottky Diode Ionizing Radiation Detectors./
作者:
Wang, Jinghui.
出版者:
Ann Arbor : ProQuest Dissertations & Theses, : 2014,
面頁冊數:
174 p.
附註:
Source: Dissertation Abstracts International, Volume: 77-04(E), Section: B.
Contained By:
Dissertation Abstracts International77-04B(E).
標題:
Nuclear engineering. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3732395
ISBN:
9781339193137
Fabrication, Characterization and Simulation of Sandwich Structure GaN Schottky Diode Ionizing Radiation Detectors.
Wang, Jinghui.
Fabrication, Characterization and Simulation of Sandwich Structure GaN Schottky Diode Ionizing Radiation Detectors.
- Ann Arbor : ProQuest Dissertations & Theses, 2014 - 174 p.
Source: Dissertation Abstracts International, Volume: 77-04(E), Section: B.
Thesis (Ph.D.)--The Ohio State University, 2014.
The current shortage of Helium-3 proposes a challenge for searching other neutron detection methods to fulfill the increased demand in both industry and academic research applications. Semiconductor radiation detector is one trend of this campaign due to its potential to provide portable, high detection efficiency devices. As a semiconductor material, Gallium Nitride (GaN) was recognized as one of the most promising candidates for radiation detection, especially for operating in harsh environments, mainly due to its superior properties, such as the wide band-gap, large displacement energy, and high thermal stability, etc.
ISBN: 9781339193137Subjects--Topical Terms:
595435
Nuclear engineering.
Fabrication, Characterization and Simulation of Sandwich Structure GaN Schottky Diode Ionizing Radiation Detectors.
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The current shortage of Helium-3 proposes a challenge for searching other neutron detection methods to fulfill the increased demand in both industry and academic research applications. Semiconductor radiation detector is one trend of this campaign due to its potential to provide portable, high detection efficiency devices. As a semiconductor material, Gallium Nitride (GaN) was recognized as one of the most promising candidates for radiation detection, especially for operating in harsh environments, mainly due to its superior properties, such as the wide band-gap, large displacement energy, and high thermal stability, etc.
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In this research, sandwich structure Schottky diodes were fabricated on n-type bulk GaN substrate with thickness of ∼ 500 micrometers. The radiation response was achieved by both using 5.4 MeV alpha particles emitted from Am-241 source and a neutron converter 6LiF:ZnS foil (0.3 mm). The results are promising as a high charge collection efficiency was found. The devices were then characterized by current-voltage, capacitance-voltage, and alpha spectroscopy, and the corresponding electrical properties were derived. The major device parameters were obtained including the doping level of these wafers (∼ 1016 cm-3), the depletion region depth (several micrometer under several volts), and the Schottky barrier height (0.75 eV). In addition, high temperature current-voltage characteristic and the neutron radiation effect were studied to investigate GaN sensor's potential application in harsh environment. Furthermore, simulation was performed by Sentaurus TCAD to understand the charge collection process within these detectors. This research provides some insights on future study of using GaN for radiation detection applications.
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