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Thin Film Delamination Using a High ...
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Sherman, Bradley.
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Thin Film Delamination Using a High Power Pulsed Laser Materials Interaction.
Record Type:
Electronic resources : Monograph/item
Title/Author:
Thin Film Delamination Using a High Power Pulsed Laser Materials Interaction./
Author:
Sherman, Bradley.
Published:
Ann Arbor : ProQuest Dissertations & Theses, : 2016,
Description:
136 p.
Notes:
Source: Dissertation Abstracts International, Volume: 78-02(E), Section: B.
Contained By:
Dissertation Abstracts International78-02B(E).
Subject:
Materials science. -
Online resource:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10160450
ISBN:
9781369153576
Thin Film Delamination Using a High Power Pulsed Laser Materials Interaction.
Sherman, Bradley.
Thin Film Delamination Using a High Power Pulsed Laser Materials Interaction.
- Ann Arbor : ProQuest Dissertations & Theses, 2016 - 136 p.
Source: Dissertation Abstracts International, Volume: 78-02(E), Section: B.
Thesis (Ph.D.)--Northwestern University, 2016.
Thin films attached to substrates are only effective while the film is adhered to the substrate. When the film begins to spall the whole system can fail, thus knowing the working strength of the film substrate system is important when designing structures. Surface acoustic waves (SAWs) are suitable for characterization of thin film mechanical properties due to the confinement of their energy within a shallow depth from a material surface. In this project, we study the feasibility of inducing dynamic interfacial failure in thin films using surface waves generated by a high power pulsed laser. Surface acoustic waves are modeled using a finite element numerical code, where the ablative interaction between the pulsed laser and the incident film is modeled using equivalent surface mechanical stresses. The numerical results are validated using experimental results from a laser ultrasonic setup. Once validated the normal film-substrate interfacial stress can be extracted from the numerical code and tends to be in the mega-Pascal range. This study uses pulsed laser generation to produce SAW in various metallic thin film/substrate systems. Each system varies in its response based on its dispersive relationship and as such requires individualized numerical modeling to match the experimental data. In addition to pulsed SAW excitation using an ablative source, a constrained thermo-mechanical load produced by the ablation of a metal film under a polymer layer is explored to generate larger dynamic mechanical stresses. These stresses are sufficient to delaminate the thin film in a manner similar to a peel test. However, since the loading is produced by a pulsed laser source, it occurs at a much faster rate, limiting the influence of slower damage modes that are present in quasi-static loading. This approach is explored to predict the interfacial fracture toughness of weak thin film interfaces.
ISBN: 9781369153576Subjects--Topical Terms:
543314
Materials science.
Thin Film Delamination Using a High Power Pulsed Laser Materials Interaction.
LDR
:02830nmm a2200289 4500
001
2122479
005
20170922124920.5
008
180830s2016 ||||||||||||||||| ||eng d
020
$a
9781369153576
035
$a
(MiAaPQ)AAI10160450
035
$a
AAI10160450
040
$a
MiAaPQ
$c
MiAaPQ
100
1
$a
Sherman, Bradley.
$0
(orcid)0000-0002-5173-3832
$3
3284451
245
1 0
$a
Thin Film Delamination Using a High Power Pulsed Laser Materials Interaction.
260
1
$a
Ann Arbor :
$b
ProQuest Dissertations & Theses,
$c
2016
300
$a
136 p.
500
$a
Source: Dissertation Abstracts International, Volume: 78-02(E), Section: B.
500
$a
Adviser: Oluwaseyi Balogun.
502
$a
Thesis (Ph.D.)--Northwestern University, 2016.
520
$a
Thin films attached to substrates are only effective while the film is adhered to the substrate. When the film begins to spall the whole system can fail, thus knowing the working strength of the film substrate system is important when designing structures. Surface acoustic waves (SAWs) are suitable for characterization of thin film mechanical properties due to the confinement of their energy within a shallow depth from a material surface. In this project, we study the feasibility of inducing dynamic interfacial failure in thin films using surface waves generated by a high power pulsed laser. Surface acoustic waves are modeled using a finite element numerical code, where the ablative interaction between the pulsed laser and the incident film is modeled using equivalent surface mechanical stresses. The numerical results are validated using experimental results from a laser ultrasonic setup. Once validated the normal film-substrate interfacial stress can be extracted from the numerical code and tends to be in the mega-Pascal range. This study uses pulsed laser generation to produce SAW in various metallic thin film/substrate systems. Each system varies in its response based on its dispersive relationship and as such requires individualized numerical modeling to match the experimental data. In addition to pulsed SAW excitation using an ablative source, a constrained thermo-mechanical load produced by the ablation of a metal film under a polymer layer is explored to generate larger dynamic mechanical stresses. These stresses are sufficient to delaminate the thin film in a manner similar to a peel test. However, since the loading is produced by a pulsed laser source, it occurs at a much faster rate, limiting the influence of slower damage modes that are present in quasi-static loading. This approach is explored to predict the interfacial fracture toughness of weak thin film interfaces.
590
$a
School code: 0163.
650
4
$a
Materials science.
$3
543314
650
4
$a
Acoustics.
$3
879105
690
$a
0794
690
$a
0986
710
2
$a
Northwestern University.
$b
Civil and Environmental Engineering.
$3
1021864
773
0
$t
Dissertation Abstracts International
$g
78-02B(E).
790
$a
0163
791
$a
Ph.D.
792
$a
2016
793
$a
English
856
4 0
$u
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10160450
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