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Electron probe sub-micron analysis i...
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Gopon, Phillip N.
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Electron probe sub-micron analysis in geoscience: Problems and potential solutions of low voltage electron microprobe analysis, as applied to reduced lunar phases and pyroxene lamellae.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Electron probe sub-micron analysis in geoscience: Problems and potential solutions of low voltage electron microprobe analysis, as applied to reduced lunar phases and pyroxene lamellae./
作者:
Gopon, Phillip N.
出版者:
Ann Arbor : ProQuest Dissertations & Theses, : 2016,
面頁冊數:
201 p.
附註:
Source: Dissertation Abstracts International, Volume: 78-01(E), Section: B.
Contained By:
Dissertation Abstracts International78-01B(E).
標題:
Geology. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10154796
ISBN:
9781369098891
Electron probe sub-micron analysis in geoscience: Problems and potential solutions of low voltage electron microprobe analysis, as applied to reduced lunar phases and pyroxene lamellae.
Gopon, Phillip N.
Electron probe sub-micron analysis in geoscience: Problems and potential solutions of low voltage electron microprobe analysis, as applied to reduced lunar phases and pyroxene lamellae.
- Ann Arbor : ProQuest Dissertations & Theses, 2016 - 201 p.
Source: Dissertation Abstracts International, Volume: 78-01(E), Section: B.
Thesis (Ph.D.)--The University of Wisconsin - Madison, 2016.
Conventional electron-probe microanalysis (EPMA) has an X-ray analytical spatial resolution on the order of 1-4 mum width/depth. Many of the naturally occurring Fe-Si compounds analyzed in this study are smaller than 1 im in size, requiring the use of lower accelerating potentials and non-standard X-ray lines for analysis. The problems with the use of low energy Xray lines (soft X-rays) of iron for quantitative analyses are discussed and a review is given of the alternative X-ray lines that may be used for iron at or below 5 keV (i.e., accelerating voltage that allows analysis of areas of interest smaller than 1 mum). Problems include the increased sensitivity to surface effects for soft X-rays, peak shifts (induced by chemical bonding, differential selfabsorption, and/or buildup of carbon contamination), uncertainties in the mass attenuation coefficient (MAC) for X-ray lines near absorption edges, and issues with spectral resolution and count rates from the available Bragg diffractors. In addition to the results from the traditionally used Fe Lalpha line, alternative approaches, utilizing Fe Lbeta, and Fe Ll-n lines, are discussed.
ISBN: 9781369098891Subjects--Topical Terms:
516570
Geology.
Electron probe sub-micron analysis in geoscience: Problems and potential solutions of low voltage electron microprobe analysis, as applied to reduced lunar phases and pyroxene lamellae.
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Conventional electron-probe microanalysis (EPMA) has an X-ray analytical spatial resolution on the order of 1-4 mum width/depth. Many of the naturally occurring Fe-Si compounds analyzed in this study are smaller than 1 im in size, requiring the use of lower accelerating potentials and non-standard X-ray lines for analysis. The problems with the use of low energy Xray lines (soft X-rays) of iron for quantitative analyses are discussed and a review is given of the alternative X-ray lines that may be used for iron at or below 5 keV (i.e., accelerating voltage that allows analysis of areas of interest smaller than 1 mum). Problems include the increased sensitivity to surface effects for soft X-rays, peak shifts (induced by chemical bonding, differential selfabsorption, and/or buildup of carbon contamination), uncertainties in the mass attenuation coefficient (MAC) for X-ray lines near absorption edges, and issues with spectral resolution and count rates from the available Bragg diffractors. In addition to the results from the traditionally used Fe Lalpha line, alternative approaches, utilizing Fe Lbeta, and Fe Ll-n lines, are discussed.
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