東華大學圖書館 |

Language: English

Help

回圖書館首頁

手機版館藏查詢

Back

Switch To: Labeled | MARC Mode | ISBD

Outlook and challenges of nano devic...

Li, Ting.

Linked to FindBook

Google Book

Amazon

博客來

Outlook and challenges of nano devices, sensors, and MEMS

Record Type:	Electronic resources : Monograph/item
Title/Author:	Outlook and challenges of nano devices, sensors, and MEMS/ edited by Ting Li, Ziv Liu.
other author:	Li, Ting.
Published:	Cham :Springer International Publishing : : 2017.,
Description:	xvi, 521 p. :ill. (some col.), digital ;24 cm.
[NT 15003449]:	Introduction -- High-k dielectric for nanoscale MOS devices -- Performance, optimization, and reliability of FinFET devices -- Performance, optimization, and challenges of emerging nanowire field-effect transistors -- Graphene technology for future MEMS and sensor applications -- Nanoscale sensors for next-generation optical transceiver applications -- Nanoscale MEMS for future optical communication applications -- Nanoscale devices for biomedical applications -- Effect of nanoscale structure on reliability of nano devices and sensors -- Compact modeling of nano devices and sensors -- Three-dimensional TCAD simulation of nano semiconductor devices -- Fabrication of nano devices based on novel material -- Novel processing technology for fabricating nano devices and sensors -- Conclusions.
Contained By:	Springer eBooks
Subject:	Nanotechnology. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-50824-5
ISBN:	9783319508245

Outlook and challenges of nano devices, sensors, and MEMS
Outlook and challenges of nano devices, sensors, and MEMS[electronic resource] /edited by Ting Li, Ziv Liu. - Cham :Springer International Publishing :2017. - xvi, 521 p. :ill. (some col.), digital ;24 cm.

Introduction -- High-k dielectric for nanoscale MOS devices -- Performance, optimization, and reliability of FinFET devices -- Performance, optimization, and challenges of emerging nanowire field-effect transistors -- Graphene technology for future MEMS and sensor applications -- Nanoscale sensors for next-generation optical transceiver applications -- Nanoscale MEMS for future optical communication applications -- Nanoscale devices for biomedical applications -- Effect of nanoscale structure on reliability of nano devices and sensors -- Compact modeling of nano devices and sensors -- Three-dimensional TCAD simulation of nano semiconductor devices -- Fabrication of nano devices based on novel material -- Novel processing technology for fabricating nano devices and sensors -- Conclusions.

This book provides readers with an overview of the design, fabrication, simulation, and reliability of nanoscale semiconductor devices, MEMS, and sensors, as they serve for realizing the next-generation internet of things. The authors focus on how the nanoscale structures interact with the electrical and/or optical performance, how to find optimal solutions to achieve the best outcome, how these apparatus can be designed via models and simulations, how to improve reliability, and what are the possible challenges and roadblocks moving forward.

ISBN: 9783319508245

Standard No.: 10.1007/978-3-319-50824-5doiSubjects--Topical Terms:

526235
Nanotechnology.

LC Class. No.: T174.7

Dewey Class. No.: 620.5

Outlook and challenges of nano devices, sensors, and MEMS
LDR:02287nmm a2200313 a 4500 001 2090308
003 DE-He213
005 20170822154233.0
006 m d
007 cr nn 008maaau
008 171013s2017 gw s 0 eng d
020 $a 9783319508245 $q (electronic bk.)
020 $a 9783319508221 $q (paper)
024 7 $a 10.1007/978-3-319-50824-5 $2 doi
035 $a 978-3-319-50824-5
040 $a GP $c GP
041 0 $a eng
050 4 $a T174.7
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
082 0 4 $a 620.5 $2 23
090 $a T174.7 $b .O94 2017
245 0 0 $a Outlook and challenges of nano devices, sensors, and MEMS $h [electronic resource] / $c edited by Ting Li, Ziv Liu.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2017.
300 $a xvi, 521 p. : $b ill. (some col.), digital ; $c 24 cm.
505 0 $a Introduction -- High-k dielectric for nanoscale MOS devices -- Performance, optimization, and reliability of FinFET devices -- Performance, optimization, and challenges of emerging nanowire field-effect transistors -- Graphene technology for future MEMS and sensor applications -- Nanoscale sensors for next-generation optical transceiver applications -- Nanoscale MEMS for future optical communication applications -- Nanoscale devices for biomedical applications -- Effect of nanoscale structure on reliability of nano devices and sensors -- Compact modeling of nano devices and sensors -- Three-dimensional TCAD simulation of nano semiconductor devices -- Fabrication of nano devices based on novel material -- Novel processing technology for fabricating nano devices and sensors -- Conclusions.
520 $a This book provides readers with an overview of the design, fabrication, simulation, and reliability of nanoscale semiconductor devices, MEMS, and sensors, as they serve for realizing the next-generation internet of things. The authors focus on how the nanoscale structures interact with the electrical and/or optical performance, how to find optimal solutions to achieve the best outcome, how these apparatus can be designed via models and simulations, how to improve reliability, and what are the possible challenges and roadblocks moving forward.
650 0 $a Nanotechnology. $3 526235
650 0 $a Microelectromechanical systems. $3 567138
650 0 $a Nanostructured materials. $3 584856
650 1 4 $a Engineering. $3 586835
650 2 4 $a Circuits and Systems. $3 896527
650 2 4 $a Electronic Circuits and Devices. $3 1245773
650 2 4 $a Nanotechnology and Microengineering. $3 1005737
700 1 $a Li, Ting. $3 3188372
700 1 $a Liu, Ziv. $3 3221736
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-50824-5
950 $a Engineering (Springer-11647)