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Scanning tunneling microscope charac...

Kelley, Murray.

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Scanning tunneling microscope characterization of nickel thin film nucleation and growth.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Scanning tunneling microscope characterization of nickel thin film nucleation and growth./
作者:	Kelley, Murray.
面頁冊數:	174 p.
附註:	Source: Masters Abstracts International, Volume: 28-02, page: 2910.
Contained By:	Masters Abstracts International28-02.
標題:	Condensed matter physics. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1338523

Scanning tunneling microscope characterization of nickel thin film nucleation and growth.
Kelley, Murray.

Scanning tunneling microscope characterization of nickel thin film nucleation and growth. - 174 p.

Source: Masters Abstracts International, Volume: 28-02, page: 2910.

Thesis (M.S.)--The University of Arizona, 1989.

A study of the nucleation, growth and final microstructure of vacuum deposited nickel films has been performed using scanning tunneling microscopy (STM) as the primary research instrument. Typical nucleation conditions are reported for nickel films grown on partially shadowed highly-oriented pyrolytic graphite (HOPG), and techniques are developed for using the STM to catalog film islands instead of more conventional electron microscopes. Values for the activation energy of surface diffusion, critical nucleus size, changes in the saturation nucleation density with temperature, and spatial variations in the nucleation rate are included.Subjects--Topical Terms:

3173567
Condensed matter physics.

Scanning tunneling microscope characterization of nickel thin film nucleation and growth.
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035 $a (MiAaPQ)AAI1338523
035 $a AAI1338523
040 $a MiAaPQ $c MiAaPQ
100 1 $a Kelley, Murray. $3 3185993
245 1 0 $a Scanning tunneling microscope characterization of nickel thin film nucleation and growth.
300 $a 174 p.
500 $a Source: Masters Abstracts International, Volume: 28-02, page: 2910.
500 $a Director: Ursula J. Gibson.
502 $a Thesis (M.S.)--The University of Arizona, 1989.
520 $a A study of the nucleation, growth and final microstructure of vacuum deposited nickel films has been performed using scanning tunneling microscopy (STM) as the primary research instrument. Typical nucleation conditions are reported for nickel films grown on partially shadowed highly-oriented pyrolytic graphite (HOPG), and techniques are developed for using the STM to catalog film islands instead of more conventional electron microscopes. Values for the activation energy of surface diffusion, critical nucleus size, changes in the saturation nucleation density with temperature, and spatial variations in the nucleation rate are included.
520 $a Roughening and microstructure changes observed with STM are reported as functions of substrate temperature and deposition angle for nickel films grown on highly-oriented pyrolytic graphite and fused silica. Conventional film RMS roughness values are compared to microRMS values derived from STM data and STM images of film microstructure are compared with SEM and optical microscope photographs.
590 $a School code: 0009.
650 4 $a Condensed matter physics. $3 3173567
650 4 $a Materials science. $3 543314
690 $a 0611
690 $a 0794
710 2 $a The University of Arizona. $3 1017508
773 0 $t Masters Abstracts International $g 28-02.
790 $a 0009
791 $a M.S.
792 $a 1989
793 $a English
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1338523