語系:
繁體中文
English
說明(常見問題)
回圖書館首頁
手機版館藏查詢
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
Metrology and physical mechanisms in...
~
Celano, Umberto.
FindBook
Google Book
Amazon
博客來
Metrology and physical mechanisms in new generation ionic devices
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Metrology and physical mechanisms in new generation ionic devices/ by Umberto Celano.
作者:
Celano, Umberto.
出版者:
Cham :Springer International Publishing : : 2016.,
面頁冊數:
xxiv, 175 p. :ill. (some col.), digital ;24 cm.
內容註:
Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.
Contained By:
Springer eBooks
標題:
Thin films. -
電子資源:
http://dx.doi.org/10.1007/978-3-319-39531-9
ISBN:
9783319395319
Metrology and physical mechanisms in new generation ionic devices
Celano, Umberto.
Metrology and physical mechanisms in new generation ionic devices
[electronic resource] /by Umberto Celano. - Cham :Springer International Publishing :2016. - xxiv, 175 p. :ill. (some col.), digital ;24 cm. - Springer theses,2190-5053. - Springer theses..
Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.
The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
ISBN: 9783319395319
Standard No.: 10.1007/978-3-319-39531-9doiSubjects--Topical Terms:
626403
Thin films.
LC Class. No.: QC176.83
Dewey Class. No.: 621.38152
Metrology and physical mechanisms in new generation ionic devices
LDR
:01812nmm a2200337 a 4500
001
2041663
003
DE-He213
005
20161130170028.0
006
m d
007
cr nn 008maaau
008
170118s2016 gw s 0 eng d
020
$a
9783319395319
$q
(electronic bk.)
020
$a
9783319395302
$q
(paper)
024
7
$a
10.1007/978-3-319-39531-9
$2
doi
035
$a
978-3-319-39531-9
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
QC176.83
072
7
$a
PNFS
$2
bicssc
072
7
$a
PDND
$2
bicssc
072
7
$a
SCI078000
$2
bisacsh
082
0 4
$a
621.38152
$2
22
090
$a
QC176.83
$b
.C392 2016
100
1
$a
Celano, Umberto.
$3
2200412
245
1 0
$a
Metrology and physical mechanisms in new generation ionic devices
$h
[electronic resource] /
$c
by Umberto Celano.
260
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2016.
300
$a
xxiv, 175 p. :
$b
ill. (some col.), digital ;
$c
24 cm.
490
1
$a
Springer theses,
$x
2190-5053
505
0
$a
Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.
520
$a
The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
650
0
$a
Thin films.
$3
626403
650
0
$a
Electronic apparatus and appliances.
$3
526237
650
0
$a
Metrology.
$3
1086985
650
0
$a
Nonvolatile random-access memory.
$3
2062712
650
1 4
$a
Physics.
$3
516296
650
2 4
$a
Spectroscopy and Microscopy.
$3
1066375
650
2 4
$a
Nanotechnology and Microengineering.
$3
1005737
650
2 4
$a
Characterization and Evaluation of Materials.
$3
890988
710
2
$a
SpringerLink (Online service)
$3
836513
773
0
$t
Springer eBooks
830
0
$a
Springer theses.
$3
1314442
856
4 0
$u
http://dx.doi.org/10.1007/978-3-319-39531-9
950
$a
Physics and Astronomy (Springer-11651)
筆 0 讀者評論
館藏地:
全部
電子資源
出版年:
卷號:
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
W9282525
電子資源
11.線上閱覽_V
電子書
EB QC176.83 .C392 2016
一般使用(Normal)
在架
0
1 筆 • 頁數 1 •
1
多媒體
評論
新增評論
分享你的心得
Export
取書館
處理中
...
變更密碼
登入