東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Essential knowledge for transistor-l...

Nakura, Toru.

FindBook

Google Book

Amazon

博客來

Essential knowledge for transistor-level LSI circuit design

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Essential knowledge for transistor-level LSI circuit design/ by Toru Nakura.
作者:	Nakura, Toru.
出版者:	Singapore :Springer Singapore : : 2016.,
面頁冊數:	xi, 211 p. :ill., digital ;24 cm.
內容註:	Schematic Entry -- SPICE Simulation -- Layout and Verification -- Interconnect RC Extraction -- IO Buffers -- Noise -- Problems due to the Progress of Miniaturization -- Measurement Devices -- Measurement Techniques We -- The Overall Design Procedure.
Contained By:	Springer eBooks
標題:	Integrated circuits - Large scale integration -
電子資源:	http://dx.doi.org/10.1007/978-981-10-0424-7
ISBN:	9789811004247

Essential knowledge for transistor-level LSI circuit design
Nakura, Toru.

Essential knowledge for transistor-level LSI circuit design[electronic resource] /by Toru Nakura. - Singapore :Springer Singapore :2016. - xi, 211 p. :ill., digital ;24 cm.

Schematic Entry -- SPICE Simulation -- Layout and Verification -- Interconnect RC Extraction -- IO Buffers -- Noise -- Problems due to the Progress of Miniaturization -- Measurement Devices -- Measurement Techniques We -- The Overall Design Procedure.

This book is a collection of the miscellaneous knowledge essential for transistor-level LSI circuit design, summarized as the issues that need to be considered in each design step. To design an LSI that actually functions and to be able to properly measure it, an extremely large amount of diverse, detailed knowledge is necessary. Even though one may read a textbook about an op-amp, for example, the op-amp circuit design may not actually be possible to complete in one's CAD tools. The first half of this text explains important design issues such as the operating principles of CAD tools, including schematic entry, SPICE simulation, layout and verification, and RC extraction. Then, mistake-prone topics for many circuit design beginners, resulting from their lack of consideration of these subjects, are explained including IO buffers, noise, and problems due to the progress of miniaturization. Following these topics, basic but very specialized issues for LSI circuit measurement are explained including measurement devices and measurement techniques. Readers will have the simulated experience of the whole flow from top to bottom of circuit design and measurement. The book will be useful for newcomers to a lab or to new graduates who are assigned to a circuit design group but have little experience in circuit design. This published work is also ideal for those who have some experience in circuit design, to confirm and complement the knowledge that they already possess.

ISBN: 9789811004247

Standard No.: 10.1007/978-981-10-0424-7doiSubjects--Topical Terms:

2195165
Integrated circuits
--Large scale integration

LC Class. No.: TK7874

Dewey Class. No.: 621.3815

Essential knowledge for transistor-level LSI circuit design
LDR:02718nmm a2200325 a 4500 001 2038186
003 DE-He213
005 20161021131855.0
006 m d
007 cr nn 008maaau
008 161209s2016 si s 0 eng d
020 $a 9789811004247 $q (electronic bk.)
020 $a 9789811004230 $q (paper)
024 7 $a 10.1007/978-981-10-0424-7 $2 doi
035 $a 978-981-10-0424-7
040 $a GP $c GP
041 1 $a eng $h jpn
050 4 $a TK7874
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
082 0 4 $a 621.3815 $2 23
090 $a TK7874 $b .N163 2016
100 1 $a Nakura, Toru. $3 2195164
240 1 0 $a LSI sekkei joshiki koza. $l English
245 1 0 $a Essential knowledge for transistor-level LSI circuit design $h [electronic resource] / $c by Toru Nakura.
260 $a Singapore : $b Springer Singapore : $b Imprint: Springer, $c 2016.
300 $a xi, 211 p. : $b ill., digital ; $c 24 cm.
505 0 $a Schematic Entry -- SPICE Simulation -- Layout and Verification -- Interconnect RC Extraction -- IO Buffers -- Noise -- Problems due to the Progress of Miniaturization -- Measurement Devices -- Measurement Techniques We -- The Overall Design Procedure.
520 $a This book is a collection of the miscellaneous knowledge essential for transistor-level LSI circuit design, summarized as the issues that need to be considered in each design step. To design an LSI that actually functions and to be able to properly measure it, an extremely large amount of diverse, detailed knowledge is necessary. Even though one may read a textbook about an op-amp, for example, the op-amp circuit design may not actually be possible to complete in one's CAD tools. The first half of this text explains important design issues such as the operating principles of CAD tools, including schematic entry, SPICE simulation, layout and verification, and RC extraction. Then, mistake-prone topics for many circuit design beginners, resulting from their lack of consideration of these subjects, are explained including IO buffers, noise, and problems due to the progress of miniaturization. Following these topics, basic but very specialized issues for LSI circuit measurement are explained including measurement devices and measurement techniques. Readers will have the simulated experience of the whole flow from top to bottom of circuit design and measurement. The book will be useful for newcomers to a lab or to new graduates who are assigned to a circuit design group but have little experience in circuit design. This published work is also ideal for those who have some experience in circuit design, to confirm and complement the knowledge that they already possess.
650 0 $a Integrated circuits $x Large scale integration $x Design and construction. $3 2195165
650 1 4 $a Engineering. $3 586835
650 2 4 $a Circuits and Systems. $3 896527
650 2 4 $a Information and Communication, Circuits. $3 893882
650 2 4 $a Electronic Circuits and Devices. $3 1245773
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-981-10-0424-7
950 $a Engineering (Springer-11647)