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CMOS RF circuit design for reliabili...

Yuan, Jiann-Shiun.

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CMOS RF circuit design for reliability and variability

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	CMOS RF circuit design for reliability and variability/ by Jiann-Shiun Yuan.
作者:	Yuan, Jiann-Shiun.
出版者:	Singapore :Springer Singapore : : 2016.,
面頁冊數:	vi, 106 p. :ill., digital ;24 cm.
內容註:	CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.
Contained By:	Springer eBooks
標題:	Metal oxide semiconductors, Complementary - Design and construction. -
電子資源:	http://dx.doi.org/10.1007/978-981-10-0884-9
ISBN:	9789811008849

CMOS RF circuit design for reliability and variability
Yuan, Jiann-Shiun.

CMOS RF circuit design for reliability and variability[electronic resource] /by Jiann-Shiun Yuan. - Singapore :Springer Singapore :2016. - vi, 106 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology,2191-530X. - SpringerBriefs in applied sciences and technology..

CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

ISBN: 9789811008849

Standard No.: 10.1007/978-981-10-0884-9doiSubjects--Topical Terms:

665042
Metal oxide semiconductors, Complementary
--Design and construction.

LC Class. No.: TK7874.78

Dewey Class. No.: 621.3815

CMOS RF circuit design for reliability and variability
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520 $a The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
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