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Materials characterization = introdu...

Leng, Y.

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Materials characterization = introduction to microscopic and spectroscopic methods /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Materials characterization/ Yang Leng.
其他題名:	introduction to microscopic and spectroscopic methods /
作者:	Leng, Y.
出版者:	Weinheim, Germany :Wiley-VCH, : c2013.,
面頁冊數:	1 online resource (xiv, 376 p.)
內容註:	Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
標題:	Materials. -
電子資源:	http://onlinelibrary.wiley.com/book/10.1002/9783527670772
ISBN:	9783527670772 (electronic bk.)

Materials characterization = introduction to microscopic and spectroscopic methods /
Leng, Y.

Materials characterizationintroduction to microscopic and spectroscopic methods /[electronic resource] :Yang Leng. - 2nd ed. - Weinheim, Germany :Wiley-VCH,c2013. - 1 online resource (xiv, 376 p.)

Includes bibliographical references and index.

Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).

ISBN: 9783527670772 (electronic bk.)Subjects--Topical Terms:

556501
Materials.

LC Class. No.: TA403 / .L433 2013

Dewey Class. No.: 620.11

Materials characterization = introduction to microscopic and spectroscopic methods /
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020 $a 3527670807 (electronic bk.)
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100 1 $a Leng, Y. $q (Yang) $3 1965717
245 1 0 $a Materials characterization $h [electronic resource] : $b introduction to microscopic and spectroscopic methods / $c Yang Leng.
250 $a 2nd ed.
260 $a Weinheim, Germany : $b Wiley-VCH, $c c2013.
300 $a 1 online resource (xiv, 376 p.)
504 $a Includes bibliographical references and index.
505 0 $a Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
520 $a Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
588 $a Description based on online resource; title from PDF title page (Wiley, viewed August 22, 2013).
650 0 $a Materials. $3 556501
650 0 $a Materials $x Analysis. $3 630582
856 4 0 $u http://onlinelibrary.wiley.com/book/10.1002/9783527670772