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Terrestrial radiation effects in ULS...

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Ibe, Eishi H.

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Terrestrial radiation effects in ULSI devices and electronic systems

Record Type:	Electronic resources : Monograph/item
Title/Author:	Terrestrial radiation effects in ULSI devices and electronic systems/ Eishi H. Ibe.
Author:	Ibe, Eishi H.
Published:	Singapore :John Wiley & Sons Inc., : : 2015.,
Description:	1 online resource.
Subject:	Electronic circuits - Effect of radiation on. -
Online resource:	http://onlinelibrary.wiley.com/book/10.1002/9781118479308
ISBN:	9781118479308 (electronic bk.)

Terrestrial radiation effects in ULSI devices and electronic systems
Ibe, Eishi H.

Terrestrial radiation effects in ULSI devices and electronic systems[electronic resource] /Eishi H. Ibe. - Singapore :John Wiley & Sons Inc., :2015. - 1 online resource.

Includes bibliographical references and index.

ISBN: 9781118479308 (electronic bk.)

LCCN: 2014022693Subjects--Topical Terms:

2147314
Electronic circuits
--Effect of radiation on.

LC Class. No.: TK7870.285

Dewey Class. No.: 621.3815

Terrestrial radiation effects in ULSI devices and electronic systems
LDR:01082cmm a2200325 i 4500 001 2002703
003 OCoLC
005 20150118112736.0
006 m o d
007 cr |||||||||||
008 151223s2015 si ob 001 0 eng
010 $a 2014022693
020 $a 9781118479308 (electronic bk.)
020 $a 1118479300 (electronic bk.)
020 $a 9781118479315 (electronic bk.)
020 $a 1118479319 (electronic bk.)
020 $z 9781118479322
020 $z 1118479327
020 $z 9781118479292 (cloth : alk. paper)
020 $z 1118479297 (cloth : alk. paper)
035 $a (OCoLC)881318367
035 $a ocn881318367
040 $a DLC $b eng $c DLC $d OCLCO $d DG1 $d N
050 1 0 $a TK7870.285
082 0 0 $a 621.3815 $2 23
100 1 $a Ibe, Eishi H. $3 2147313
245 1 0 $a Terrestrial radiation effects in ULSI devices and electronic systems $h [electronic resource] / $c Eishi H. Ibe.
260 $a Singapore : $b John Wiley & Sons Inc., : $b IEEE, $c 2015.
300 $a 1 online resource.
504 $a Includes bibliographical references and index.
588 0 $a Print version record.
650 0 $a Electronic circuits $x Effect of radiation on. $3 2147314
650 0 $a Integrated circuits $x Ultra large scale integration $x Reliability. $3 2147315
650 0 $a Integrated circuits $x Effect of radiation on. $3 1067923
856 4 0 $u http://onlinelibrary.wiley.com/book/10.1002/9781118479308

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W9270612

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11.線上閱覽_V

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EB TK7870.285

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