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Introduction to quantum metrology = ...

Nawrocki, Waldemar.

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Introduction to quantum metrology = quantum standards and instrumentation /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Introduction to quantum metrology/ by Waldemar Nawrocki.
其他題名:	quantum standards and instrumentation /
作者:	Nawrocki, Waldemar.
出版者:	Cham :Springer International Publishing : : 2015.,
面頁冊數:	xiii, 279 p. :ill., digital ;24 cm.
內容註:	Theoretical Background of Quantum Metrology -- Measures, Standards and Systems of Units -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect -- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures -- Single Electron Tunneling and Possible Current Standard -- Atomic Clocks and Time Scales -- Interferometers and Measurements of Length -- Scanning Probe Microscopes -- Other Quantum Detectors -- Standards of the Kilogram Based on Fundamental Physical Constants.
Contained By:	Springer eBooks
標題:	Physical measurements. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-15669-9
ISBN:	9783319156699 (electronic bk.)

Introduction to quantum metrology = quantum standards and instrumentation /
Nawrocki, Waldemar.

Introduction to quantum metrologyquantum standards and instrumentation /[electronic resource] :by Waldemar Nawrocki. - Cham :Springer International Publishing :2015. - xiii, 279 p. :ill., digital ;24 cm.

Theoretical Background of Quantum Metrology -- Measures, Standards and Systems of Units -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect -- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures -- Single Electron Tunneling and Possible Current Standard -- Atomic Clocks and Time Scales -- Interferometers and Measurements of Length -- Scanning Probe Microscopes -- Other Quantum Detectors -- Standards of the Kilogram Based on Fundamental Physical Constants.

This book presents the theory of quantum effects used in metrology and results of the author's own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.

ISBN: 9783319156699 (electronic bk.)

Standard No.: 10.1007/978-3-319-15669-9doiSubjects--Topical Terms:

540265
Physical measurements.

LC Class. No.: QC39

Dewey Class. No.: 530.8

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520 $a This book presents the theory of quantum effects used in metrology and results of the author's own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
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