語系:
繁體中文
English
說明(常見問題)
回圖書館首頁
手機版館藏查詢
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
On-chip electro-static discharge (ES...
~
Cui, Qiang.
FindBook
Google Book
Amazon
博客來
On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits/ by Qiang Cui ... [et al.].
其他作者:
Cui, Qiang.
出版者:
Cham :Springer International Publishing : : 2015.,
面頁冊數:
xvii, 86 p. :ill., digital ;24 cm.
內容註:
Basics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion.
Contained By:
Springer eBooks
標題:
Radio frequency integrated circuits. -
電子資源:
http://dx.doi.org/10.1007/978-3-319-10819-3
ISBN:
9783319108193 (electronic bk.)
On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits
On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits
[electronic resource] /by Qiang Cui ... [et al.]. - Cham :Springer International Publishing :2015. - xvii, 86 p. :ill., digital ;24 cm.
Basics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS) The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs' ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance.
ISBN: 9783319108193 (electronic bk.)
Standard No.: 10.1007/978-3-319-10819-3doiSubjects--Topical Terms:
817181
Radio frequency integrated circuits.
LC Class. No.: TK7874.78
Dewey Class. No.: 621.38412
On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits
LDR
:02364nmm a2200313 a 4500
001
1997923
003
DE-He213
005
20151026145804.0
006
m d
007
cr nn 008maaau
008
151112s2015 gw s 0 eng d
020
$a
9783319108193 (electronic bk.)
020
$a
9783319108186 (paper)
024
7
$a
10.1007/978-3-319-10819-3
$2
doi
035
$a
978-3-319-10819-3
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TK7874.78
072
7
$a
TJFC
$2
bicssc
072
7
$a
TEC008010
$2
bisacsh
082
0 4
$a
621.38412
$2
23
090
$a
TK7874.78
$b
.O58 2015
245
0 0
$a
On-chip electro-static discharge (ESD) protection for radio-frequency integrated circuits
$h
[electronic resource] /
$c
by Qiang Cui ... [et al.].
260
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2015.
300
$a
xvii, 86 p. :
$b
ill., digital ;
$c
24 cm.
505
0
$a
Basics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion.
520
$a
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS) The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs' ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance.
650
0
$a
Radio frequency integrated circuits.
$3
817181
650
1 4
$a
Engineering.
$3
586835
650
2 4
$a
Circuits and Systems.
$3
896527
650
2 4
$a
Electronic Circuits and Devices.
$3
1245773
650
2 4
$a
Electronics and Microelectronics, Instrumentation.
$3
893838
700
1
$a
Cui, Qiang.
$3
2139343
710
2
$a
SpringerLink (Online service)
$3
836513
773
0
$t
Springer eBooks
856
4 0
$u
http://dx.doi.org/10.1007/978-3-319-10819-3
950
$a
Engineering (Springer-11647)
筆 0 讀者評論
館藏地:
全部
電子資源
出版年:
卷號:
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
W9268634
電子資源
01.外借(書)_YB
電子書
EB TK7874.78 .O58 2015
一般使用(Normal)
在架
0
1 筆 • 頁數 1 •
1
多媒體
評論
新增評論
分享你的心得
Export
取書館
處理中
...
變更密碼
登入