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Surface science tools for nanomateri...

Kumar, Challa S. S. R.

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Surface science tools for nanomaterials characterization

Record Type:	Electronic resources : Monograph/item
Title/Author:	Surface science tools for nanomaterials characterization/ edited by Challa S. S. R. Kumar.
other author:	Kumar, Challa S. S. R.
Published:	Berlin, Heidelberg :Springer Berlin Heidelberg : : 2015.,
Description:	x, 652 p. :ill. (some col.), digital ;24 cm.
[NT 15003449]:	Higher Resolution Scanning Probe Methods for Magnetic Imaging -- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials -- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography -- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy -- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) -- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy -- Magnetic Force Microscopy -- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films -- FIM-Characterized Tips for SPM -- Scanning Conductive Torsion Mode Microscopy -- Scanning Probe Acceleration Microscopy (SPAM) -- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures -- Field Ion Microscopy (FIM) -- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.
Contained By:	Springer eBooks
Subject:	Nanochemistry. -
Online resource:	http://dx.doi.org/10.1007/978-3-662-44551-8
ISBN:	9783662445518 (electronic bk.)

Surface science tools for nanomaterials characterization
Surface science tools for nanomaterials characterization[electronic resource] /edited by Challa S. S. R. Kumar. - Berlin, Heidelberg :Springer Berlin Heidelberg :2015. - x, 652 p. :ill. (some col.), digital ;24 cm.

Higher Resolution Scanning Probe Methods for Magnetic Imaging -- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials -- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography -- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy -- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) -- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy -- Magnetic Force Microscopy -- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films -- FIM-Characterized Tips for SPM -- Scanning Conductive Torsion Mode Microscopy -- Scanning Probe Acceleration Microscopy (SPAM) -- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures -- Field Ion Microscopy (FIM) -- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.

Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

ISBN: 9783662445518 (electronic bk.)

Standard No.: 10.1007/978-3-662-44551-8doiSubjects--Topical Terms:

813421
Nanochemistry.

LC Class. No.: QC176.8.N35

Dewey Class. No.: 620.5

Surface science tools for nanomaterials characterization
LDR:02472nmm a2200313 a 4500 001 1997792
003 DE-He213
005 20151019112035.0
006 m d
007 cr nn 008maaau
008 151112s2015 gw s 0 eng d
020 $a 9783662445518 (electronic bk.)
020 $a 9783662445501 (paper)
024 7 $a 10.1007/978-3-662-44551-8 $2 doi
035 $a 978-3-662-44551-8
040 $a GP $c GP
041 0 $a eng
050 4 $a QC176.8.N35
072 7 $a TBN $2 bicssc
072 7 $a SCI050000 $2 bisacsh
082 0 4 $a 620.5 $2 23
090 $a QC176.8.N35 $b S961 2015
245 0 0 $a Surface science tools for nanomaterials characterization $h [electronic resource] / $c edited by Challa S. S. R. Kumar.
260 $a Berlin, Heidelberg : $b Springer Berlin Heidelberg : $b Imprint: Springer, $c 2015.
300 $a x, 652 p. : $b ill. (some col.), digital ; $c 24 cm.
505 0 $a Higher Resolution Scanning Probe Methods for Magnetic Imaging -- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials -- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography -- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy -- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) -- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy -- Magnetic Force Microscopy -- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films -- FIM-Characterized Tips for SPM -- Scanning Conductive Torsion Mode Microscopy -- Scanning Probe Acceleration Microscopy (SPAM) -- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures -- Field Ion Microscopy (FIM) -- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.
520 $a Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
650 0 $a Nanochemistry. $3 813421
650 0 $a Materials. $3 556501
650 0 $a Nanostructured materials $x Analysis. $3 1532094
650 1 4 $a Chemistry. $3 516420
650 2 4 $a Nanotechnology. $3 526235
650 2 4 $a Nanoscale Science and Technology. $3 1244861
700 1 $a Kumar, Challa S. S. R. $3 1568951
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-3-662-44551-8
950 $a Chemistry and Materials Science (Springer-11644)