東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

CMOS test and evaluation = a physica...

Bhushan, Manjul.

FindBook

Google Book

Amazon

博客來

CMOS test and evaluation = a physical perspective /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	CMOS test and evaluation/ by Manjul Bhushan, Mark B. Ketchen.
其他題名:	a physical perspective /
作者:	Bhushan, Manjul.
其他作者:	Ketchen, Mark B.
出版者:	New York, NY :Springer New York : : 2015.,
面頁冊數:	xiii, 424 p. :ill., digital ;24 cm.
內容註:	Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
Contained By:	Springer eBooks
標題:	System safety. -
電子資源:	http://dx.doi.org/10.1007/978-1-4939-1349-7
ISBN:	9781493913497 (electronic bk.)

CMOS test and evaluation = a physical perspective /
Bhushan, Manjul.

CMOS test and evaluationa physical perspective /[electronic resource] :by Manjul Bhushan, Mark B. Ketchen. - New York, NY :Springer New York :2015. - xiii, 424 p. :ill., digital ;24 cm.

Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.

This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.

ISBN: 9781493913497 (electronic bk.)

Standard No.: 10.1007/978-1-4939-1349-7doiSubjects--Topical Terms:

860861
System safety.

LC Class. No.: TK7874

Dewey Class. No.: 621.381

CMOS test and evaluation = a physical perspective /
LDR:02276nmm a2200325 a 4500 001 1994526
003 DE-He213
005 20150805113011.0
006 m d
007 cr nn 008maaau
008 151019s2015 nyu s 0 eng d
020 $a 9781493913497 (electronic bk.)
020 $a 9781493913480 (paper)
024 7 $a 10.1007/978-1-4939-1349-7 $2 doi
035 $a 978-1-4939-1349-7
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7874
072 7 $a TJF $2 bicssc
072 7 $a TEC008000 $2 bisacsh
072 7 $a TEC008070 $2 bisacsh
082 0 4 $a 621.381 $2 23
090 $a TK7874 $b .B575 2015
100 1 $a Bhushan, Manjul. $3 2133412
245 1 0 $a CMOS test and evaluation $h [electronic resource] : $b a physical perspective / $c by Manjul Bhushan, Mark B. Ketchen.
260 $a New York, NY : $b Springer New York : $b Imprint: Springer, $c 2015.
300 $a xiii, 424 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
520 $a This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.
650 0 $a System safety. $3 860861
650 0 $a Electronics. $3 517156
650 0 $a Systems engineering. $3 572511
650 0 $a Engineering. $3 586835
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 893838
650 2 4 $a Circuits and Systems. $3 896527
650 2 4 $a Semiconductors. $3 516162
650 2 4 $a Quality Control, Reliability, Safety and Risk. $3 891027
700 1 $a Ketchen, Mark B. $3 2133413
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-1-4939-1349-7
950 $a Engineering (Springer-11647)