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Hot carrier degradation in semicondu...

Grasser, Tibor.

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Hot carrier degradation in semiconductor devices

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Hot carrier degradation in semiconductor devices/ edited by Tibor Grasser.
其他作者:	Grasser, Tibor.
出版者:	Cham :Springer International Publishing : : 2015.,
面頁冊數:	x, 517 p. :ill. (some col.), digital ;24 cm.
內容註:	Part I: Beyond Lucky Electrons -- From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation -- The Energy Driven Hot Carrier Model -- Hot-Carrier Degradation in Decananometer -- Physics-based Modeling of Hot-carrier Degradation -- The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation -- Recovery from Hot Carrier Induced Degradation Through Temperature Treatment -- Characterization of MOSFET Interface States Using the Charge Pumping Technique -- Part II: CMOS and Beyond -- Channel Hot Carriers in SiGe and Ge pMOSFETs -- Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs -- Characterization and Modeling of High-Voltage LDMOS Transistors -- Compact modelling of the Hot-carrier Degradation of Integrated HV MOSFETs -- Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors.
Contained By:	Springer eBooks
標題:	Hot carriers. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-08994-2
ISBN:	9783319089942 (electronic bk.)

Hot carrier degradation in semiconductor devices
Hot carrier degradation in semiconductor devices[electronic resource] /edited by Tibor Grasser. - Cham :Springer International Publishing :2015. - x, 517 p. :ill. (some col.), digital ;24 cm.

Part I: Beyond Lucky Electrons -- From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation -- The Energy Driven Hot Carrier Model -- Hot-Carrier Degradation in Decananometer -- Physics-based Modeling of Hot-carrier Degradation -- The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation -- Recovery from Hot Carrier Induced Degradation Through Temperature Treatment -- Characterization of MOSFET Interface States Using the Charge Pumping Technique -- Part II: CMOS and Beyond -- Channel Hot Carriers in SiGe and Ge pMOSFETs -- Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs -- Characterization and Modeling of High-Voltage LDMOS Transistors -- Compact modelling of the Hot-carrier Degradation of Integrated HV MOSFETs -- Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors.

ISBN: 9783319089942 (electronic bk.)

Standard No.: 10.1007/978-3-319-08994-2doiSubjects--Topical Terms:

697421
Hot carriers.

LC Class. No.: QC611.6.H67

Dewey Class. No.: 537.6226

Hot carrier degradation in semiconductor devices
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