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Fabrication and Characterization of ...

Newton, Benjamin S.

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Fabrication and Characterization of Amorphous/Nanocrystalline Thin Film Composite.

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Fabrication and Characterization of Amorphous/Nanocrystalline Thin Film Composite./
Author:	Newton, Benjamin S.
Description:	132 p.
Notes:	Source: Dissertation Abstracts International, Volume: 75-08(E), Section: B.
Contained By:	Dissertation Abstracts International75-08B(E).
Subject:	Engineering, Materials Science. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3618547
ISBN:	9781303869228

Fabrication and Characterization of Amorphous/Nanocrystalline Thin Film Composite.
Newton, Benjamin S.

Fabrication and Characterization of Amorphous/Nanocrystalline Thin Film Composite. - 132 p.

Source: Dissertation Abstracts International, Volume: 75-08(E), Section: B.

Thesis (Ph.D.)--University of Arkansas, 2014.

Combining the absorption abilities of amorphous silicon and the electron transport capabilities of crystalline silicon would be a great advantage to not only solar cells but other semiconductor devices. In this work composite films were created using molecular beam epitaxy and electron beam deposition interchangeably as a method to create metallic precursors. Aluminum induced crystallization techniques were used to convert an amorphous silicon film with a capping layer of aluminum nanodots into a film composed of a mixture of amorphous silicon and nanocrystalline silicon. This layer was grown into the amorphous layer by cannibalizing a portion of the amorphous silicon material during the aluminum induced crystallization. Characterization was performed on films and metallic precursors utilizing SEM, TEM, ellipsometry and spectrophotometer.

ISBN: 9781303869228Subjects--Topical Terms:

1017759
Engineering, Materials Science.

Fabrication and Characterization of Amorphous/Nanocrystalline Thin Film Composite.
LDR:01728nam a2200277 4500 001 1969227
005 20141222143625.5
008 150210s2014 ||||||||||||||||| ||eng d
020 $a 9781303869228
035 $a (MiAaPQ)AAI3618547
035 $a AAI3618547
040 $a MiAaPQ $c MiAaPQ
100 1 $a Newton, Benjamin S. $3 2106511
245 1 0 $a Fabrication and Characterization of Amorphous/Nanocrystalline Thin Film Composite.
300 $a 132 p.
500 $a Source: Dissertation Abstracts International, Volume: 75-08(E), Section: B.
500 $a Adviser: Hameed Naseem.
502 $a Thesis (Ph.D.)--University of Arkansas, 2014.
520 $a Combining the absorption abilities of amorphous silicon and the electron transport capabilities of crystalline silicon would be a great advantage to not only solar cells but other semiconductor devices. In this work composite films were created using molecular beam epitaxy and electron beam deposition interchangeably as a method to create metallic precursors. Aluminum induced crystallization techniques were used to convert an amorphous silicon film with a capping layer of aluminum nanodots into a film composed of a mixture of amorphous silicon and nanocrystalline silicon. This layer was grown into the amorphous layer by cannibalizing a portion of the amorphous silicon material during the aluminum induced crystallization. Characterization was performed on films and metallic precursors utilizing SEM, TEM, ellipsometry and spectrophotometer.
590 $a School code: 0011.
650 4 $a Engineering, Materials Science. $3 1017759
650 4 $a Nanoscience. $3 587832
690 $a 0794
690 $a 0565
710 2 $a University of Arkansas. $b Microelectronics-Photonics. $3 2092249
773 0 $t Dissertation Abstracts International $g 75-08B(E).
790 $a 0011
791 $a Ph.D.
792 $a 2014
793 $a English
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3618547