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Comparing reliability of silver and ...

Sudarsanam, Hema.

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Comparing reliability of silver and silver chromium thin films on PET substrate.

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Comparing reliability of silver and silver chromium thin films on PET substrate./
作者:	Sudarsanam, Hema.
面頁冊數:	65 p.
附註:	Source: Masters Abstracts International, Volume: 52-02.
Contained By:	Masters Abstracts International52-02(E).
標題:	Engineering, Industrial. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1543648
ISBN:	9781303310652

Comparing reliability of silver and silver chromium thin films on PET substrate.
Sudarsanam, Hema.

Comparing reliability of silver and silver chromium thin films on PET substrate. - 65 p.

Source: Masters Abstracts International, Volume: 52-02.

Thesis (M.S.)--State University of New York at Binghamton, 2013.

Reliability studies help in identifying the factors that significantly contribute to the failure of the thin films. The objective of this research is to study and compare the performance of silver and silver on chromium thin films of different thicknesses (50nm, 100nm, 150nm and 200nm) on a flexible Polyethylene terephthalate (PET) substrate which is 125microm thick under high cyclic bending fatigue test as per the standards mentioned by IEC 61646-2. Research on silver as a back contact has been carried out because it is an important functional layer responsible to carry charges to produce electricity. The silver and chromium films were sputtered using DC- magnetron sputtering technique. The input factors considered for the analysis are the bending frequency, film thickness, material and bending diameter. The design of experiment technique (DOE) was used to identify the combined effect of these factors on average percentage change of electrical resistance (PCER) per 100 cycles and also for the PCER after being tested for 1000 cycles. In addition, reflectivity of both the materials before and after 1000 cyclic bending was observed. The analysis shows that addition of chromium as an adhesive layer does influences the PCER and reflectivity of the material although development of cracks was not observed even after 10,000 cycles. Also the surface morphology study performed through scanning electron microscope (SEM) and optical microscope confirms the same results. The experiment is conducted by optimizing the system used and thus aim in producing the most effective reliability analysis of the two back contacts when being manufactured in a roll to roll facility.

ISBN: 9781303310652Subjects--Topical Terms:

626639
Engineering, Industrial.

Comparing reliability of silver and silver chromium thin films on PET substrate.
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520 $a Reliability studies help in identifying the factors that significantly contribute to the failure of the thin films. The objective of this research is to study and compare the performance of silver and silver on chromium thin films of different thicknesses (50nm, 100nm, 150nm and 200nm) on a flexible Polyethylene terephthalate (PET) substrate which is 125microm thick under high cyclic bending fatigue test as per the standards mentioned by IEC 61646-2. Research on silver as a back contact has been carried out because it is an important functional layer responsible to carry charges to produce electricity. The silver and chromium films were sputtered using DC- magnetron sputtering technique. The input factors considered for the analysis are the bending frequency, film thickness, material and bending diameter. The design of experiment technique (DOE) was used to identify the combined effect of these factors on average percentage change of electrical resistance (PCER) per 100 cycles and also for the PCER after being tested for 1000 cycles. In addition, reflectivity of both the materials before and after 1000 cyclic bending was observed. The analysis shows that addition of chromium as an adhesive layer does influences the PCER and reflectivity of the material although development of cracks was not observed even after 10,000 cycles. Also the surface morphology study performed through scanning electron microscope (SEM) and optical microscope confirms the same results. The experiment is conducted by optimizing the system used and thus aim in producing the most effective reliability analysis of the two back contacts when being manufactured in a roll to roll facility.
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