Language:
English
繁體中文
Help
回圖書館首頁
手機版館藏查詢
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Comparing reliability of silver and ...
~
Sudarsanam, Hema.
Linked to FindBook
Google Book
Amazon
博客來
Comparing reliability of silver and silver chromium thin films on PET substrate.
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Comparing reliability of silver and silver chromium thin films on PET substrate./
Author:
Sudarsanam, Hema.
Description:
65 p.
Notes:
Source: Masters Abstracts International, Volume: 52-02.
Contained By:
Masters Abstracts International52-02(E).
Subject:
Engineering, Industrial. -
Online resource:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1543648
ISBN:
9781303310652
Comparing reliability of silver and silver chromium thin films on PET substrate.
Sudarsanam, Hema.
Comparing reliability of silver and silver chromium thin films on PET substrate.
- 65 p.
Source: Masters Abstracts International, Volume: 52-02.
Thesis (M.S.)--State University of New York at Binghamton, 2013.
Reliability studies help in identifying the factors that significantly contribute to the failure of the thin films. The objective of this research is to study and compare the performance of silver and silver on chromium thin films of different thicknesses (50nm, 100nm, 150nm and 200nm) on a flexible Polyethylene terephthalate (PET) substrate which is 125microm thick under high cyclic bending fatigue test as per the standards mentioned by IEC 61646-2. Research on silver as a back contact has been carried out because it is an important functional layer responsible to carry charges to produce electricity. The silver and chromium films were sputtered using DC- magnetron sputtering technique. The input factors considered for the analysis are the bending frequency, film thickness, material and bending diameter. The design of experiment technique (DOE) was used to identify the combined effect of these factors on average percentage change of electrical resistance (PCER) per 100 cycles and also for the PCER after being tested for 1000 cycles. In addition, reflectivity of both the materials before and after 1000 cyclic bending was observed. The analysis shows that addition of chromium as an adhesive layer does influences the PCER and reflectivity of the material although development of cracks was not observed even after 10,000 cycles. Also the surface morphology study performed through scanning electron microscope (SEM) and optical microscope confirms the same results. The experiment is conducted by optimizing the system used and thus aim in producing the most effective reliability analysis of the two back contacts when being manufactured in a roll to roll facility.
ISBN: 9781303310652Subjects--Topical Terms:
626639
Engineering, Industrial.
Comparing reliability of silver and silver chromium thin films on PET substrate.
LDR
:02565nam a2200289 4500
001
1967544
005
20141124080546.5
008
150210s2013 ||||||||||||||||| ||eng d
020
$a
9781303310652
035
$a
(MiAaPQ)AAI1543648
035
$a
AAI1543648
040
$a
MiAaPQ
$c
MiAaPQ
100
1
$a
Sudarsanam, Hema.
$3
2104573
245
1 0
$a
Comparing reliability of silver and silver chromium thin films on PET substrate.
300
$a
65 p.
500
$a
Source: Masters Abstracts International, Volume: 52-02.
500
$a
Adviser: Susan Lu.
502
$a
Thesis (M.S.)--State University of New York at Binghamton, 2013.
520
$a
Reliability studies help in identifying the factors that significantly contribute to the failure of the thin films. The objective of this research is to study and compare the performance of silver and silver on chromium thin films of different thicknesses (50nm, 100nm, 150nm and 200nm) on a flexible Polyethylene terephthalate (PET) substrate which is 125microm thick under high cyclic bending fatigue test as per the standards mentioned by IEC 61646-2. Research on silver as a back contact has been carried out because it is an important functional layer responsible to carry charges to produce electricity. The silver and chromium films were sputtered using DC- magnetron sputtering technique. The input factors considered for the analysis are the bending frequency, film thickness, material and bending diameter. The design of experiment technique (DOE) was used to identify the combined effect of these factors on average percentage change of electrical resistance (PCER) per 100 cycles and also for the PCER after being tested for 1000 cycles. In addition, reflectivity of both the materials before and after 1000 cyclic bending was observed. The analysis shows that addition of chromium as an adhesive layer does influences the PCER and reflectivity of the material although development of cracks was not observed even after 10,000 cycles. Also the surface morphology study performed through scanning electron microscope (SEM) and optical microscope confirms the same results. The experiment is conducted by optimizing the system used and thus aim in producing the most effective reliability analysis of the two back contacts when being manufactured in a roll to roll facility.
590
$a
School code: 0792.
650
4
$a
Engineering, Industrial.
$3
626639
650
4
$a
Alternative Energy.
$3
1035473
650
4
$a
Statistics.
$3
517247
690
$a
0546
690
$a
0363
690
$a
0463
710
2
$a
State University of New York at Binghamton.
$b
Industrial Engineering.
$3
1035516
773
0
$t
Masters Abstracts International
$g
52-02(E).
790
$a
0792
791
$a
M.S.
792
$a
2013
793
$a
English
856
4 0
$u
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1543648
based on 0 review(s)
Location:
ALL
電子資源
Year:
Volume Number:
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
Item Class
Material type
Call number
Usage Class
Loan Status
No. of reservations
Opac note
Attachments
W9262550
電子資源
11.線上閱覽_V
電子書
EB
一般使用(Normal)
On shelf
0
1 records • Pages 1 •
1
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login