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Application of Advanced Atomic Force...
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Guz, Nataliia.
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Application of Advanced Atomic Force Microscopy Techniques to Study Quantum Dots and Bio-materials.
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Application of Advanced Atomic Force Microscopy Techniques to Study Quantum Dots and Bio-materials./
Author:
Guz, Nataliia.
Description:
105 p.
Notes:
Source: Dissertation Abstracts International, Volume: 75-01(E), Section: B.
Contained By:
Dissertation Abstracts International75-01B(E).
Subject:
Physics, General. -
Online resource:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3591407
ISBN:
9781303319822
Application of Advanced Atomic Force Microscopy Techniques to Study Quantum Dots and Bio-materials.
Guz, Nataliia.
Application of Advanced Atomic Force Microscopy Techniques to Study Quantum Dots and Bio-materials.
- 105 p.
Source: Dissertation Abstracts International, Volume: 75-01(E), Section: B.
Thesis (Ph.D.)--Clarkson University, 2013.
In recent years, there has been an increase in research towards micro- and nanoscale devices as they have proliferated into diverse areas of scientific exploration. Many of the general fields of study that have greatly affected the advancement of these devices includes the investigation of their properties. The sensitivity of Atomic Force Microscopy (AFM) allows detecting charges up to the single electron value in quantum dots in ambient conditions, the measurement of steric forces on the surface of the human cell brush, determination of cell mechanics, magnetic forces, and other important properties. Utilizing AFM methods, the fast screening of quantum dot efficiency and the differences between cancer, normal (healthy) and precancer (immortalized) human cells has been investigated. The current research using AFM techniques can help to identify biophysical differences of cancer cells to advance our understanding of the resistance of the cells against the existing medicine.
ISBN: 9781303319822Subjects--Topical Terms:
1018488
Physics, General.
Application of Advanced Atomic Force Microscopy Techniques to Study Quantum Dots and Bio-materials.
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Source: Dissertation Abstracts International, Volume: 75-01(E), Section: B.
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Adviser: Igor Sokolov.
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In recent years, there has been an increase in research towards micro- and nanoscale devices as they have proliferated into diverse areas of scientific exploration. Many of the general fields of study that have greatly affected the advancement of these devices includes the investigation of their properties. The sensitivity of Atomic Force Microscopy (AFM) allows detecting charges up to the single electron value in quantum dots in ambient conditions, the measurement of steric forces on the surface of the human cell brush, determination of cell mechanics, magnetic forces, and other important properties. Utilizing AFM methods, the fast screening of quantum dot efficiency and the differences between cancer, normal (healthy) and precancer (immortalized) human cells has been investigated. The current research using AFM techniques can help to identify biophysical differences of cancer cells to advance our understanding of the resistance of the cells against the existing medicine.
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http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3591407
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