Time-of-flight secondary ion mass sp...
Xia, Nan.

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  • Time-of-flight secondary ion mass spectrometry (ToF-SIMS) characterization of conformation and orientation of adsorbed protein films.
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) characterization of conformation and orientation of adsorbed protein films./
    作者: Xia, Nan.
    面頁冊數: 179 p.
    附註: Source: Dissertation Abstracts International, Volume: 64-05, Section: B, page: 2289.
    Contained By: Dissertation Abstracts International64-05B.
    標題: Engineering, Biomedical. -
    電子資源: http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3091095
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