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Mechanics of evolving thin film stru...

Liang, Jim.

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Mechanics of evolving thin film structures.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Mechanics of evolving thin film structures./
Author:	Liang, Jim.
Description:	168 p.
Notes:	Source: Dissertation Abstracts International, Volume: 64-02, Section: B, page: 0839.
Contained By:	Dissertation Abstracts International64-02B.
Subject:	Engineering, Chemical. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3080025

Mechanics of evolving thin film structures.
Liang, Jim.

Mechanics of evolving thin film structures. - 168 p.

Source: Dissertation Abstracts International, Volume: 64-02, Section: B, page: 0839.

Thesis (Ph.D.)--Princeton University, 2003.

In the Stranski-Krastanov system, the lattice mismatch between the film and the substrate causes the film to break into islands. During annealing, both the surface energy and the elastic energy drive the islands to coarsen. Motivated by several related studies, we suggest that stable islands should form when a stiff ceiling is placed at a small gap above the film. We show that the role of elasticity is reversed: with the ceiling, the total elastic energy stored in the system increases as the islands coarsen laterally. Consequently, the islands select an equilibrium size to minimize the combined elastic energy and surface energy.Subjects--Topical Terms:

1018531
Engineering, Chemical.

Mechanics of evolving thin film structures.
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100 1 $a Liang, Jim. $3 1945733
245 1 0 $a Mechanics of evolving thin film structures.
300 $a 168 p.
500 $a Source: Dissertation Abstracts International, Volume: 64-02, Section: B, page: 0839.
500 $a Adviser: Zhigang Suo.
502 $a Thesis (Ph.D.)--Princeton University, 2003.
520 $a In the Stranski-Krastanov system, the lattice mismatch between the film and the substrate causes the film to break into islands. During annealing, both the surface energy and the elastic energy drive the islands to coarsen. Motivated by several related studies, we suggest that stable islands should form when a stiff ceiling is placed at a small gap above the film. We show that the role of elasticity is reversed: with the ceiling, the total elastic energy stored in the system increases as the islands coarsen laterally. Consequently, the islands select an equilibrium size to minimize the combined elastic energy and surface energy.
520 $a In lithographically-induced self-assembly, when a two-phase fluid confined between parallel substrates is subjected to an electric field, one phase can self-assemble into a triangular lattice of islands in another phase. We describe a theory of the stability of the island lattice. The islands select the equilibrium diameter to minimize the combined interface energy and electrostatic energy.
520 $a Furthermore, we study compressed SiGe thin film islands fabricated on a glass layer, which itself lies on a silicon wafer. Upon annealing, the glass flows, and the islands relax. A small island relaxes by in-plane expansion. A large island, however, wrinkles at the center before the in-plane relaxation arrives. The wrinkles may cause significant tensile stress in the island, leading to fracture. We model the island by the von Karman plate theory and the glass layer by the Reynolds lubrication theory. Numerical simulations evolve the in-plane expansion and the wrinkles simultaneously. We determine the critical island size, below which in-plane expansion prevails over wrinkling.
520 $a Finally, in devices that integrate dissimilar materials in small dimensions, crack extension in one material often accompanies inelastic deformation in another. We analyze a channel crack advancing in an elastic film under tension, while an underlayer creeps. We use a two-dimensional shear lag model to approximate the three-dimensional fracture process. Based on the computational results, we propose new experiments to measure fracture toughness and creep laws in small structures. Similarly, we study delayed crack initiation, steady crack growth, and transient crack growth when the underlayer is viscoelastic.
590 $a School code: 0181.
650 4 $a Engineering, Chemical. $3 1018531
650 4 $a Applied Mechanics. $3 1018410
650 4 $a Engineering, Materials Science. $3 1017759
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710 2 0 $a Princeton University. $3 645579
773 0 $t Dissertation Abstracts International $g 64-02B.
790 1 0 $a Suo, Zhigang, $e advisor
790 $a 0181
791 $a Ph.D.
792 $a 2003
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3080025