Recovering jump risk and diffusion p...
Beyer, Scott Berg.

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  • Recovering jump risk and diffusion parameters implied by market prices of short-dated options.
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Recovering jump risk and diffusion parameters implied by market prices of short-dated options./
    Author: Beyer, Scott Berg.
    Description: 179 p.
    Notes: Source: Dissertation Abstracts International, Volume: 64-07, Section: A, page: 2594.
    Contained By: Dissertation Abstracts International64-07A.
    Subject: Economics, Finance. -
    Online resource: http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3099610
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