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Adaptation of intermittent contact m...

Chan, Sandra Suk Fung.

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Adaptation of intermittent contact modes to inverted atomic force microscopy.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Adaptation of intermittent contact modes to inverted atomic force microscopy./
Author:	Chan, Sandra Suk Fung.
Description:	104 p.
Notes:	Source: Masters Abstracts International, Volume: 44-03, page: 1363.
Contained By:	Masters Abstracts International44-03.
Subject:	Chemistry, General. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=MR09137
ISBN:	9780494091371

Adaptation of intermittent contact modes to inverted atomic force microscopy.
Chan, Sandra Suk Fung.

Adaptation of intermittent contact modes to inverted atomic force microscopy. - 104 p.

Source: Masters Abstracts International, Volume: 44-03, page: 1363.

Thesis (M.Sc.)--University of Alberta (Canada), 2005.

This work is aimed at evaluating the plausibility of using atomic force microcopy (AFM) instrumentation and techniques for the measurement of interaction force and surface characterization in a high throughput manner. Investigations of the feasibility of combining tapping mode (TM) AFM and pulsed-force mode (PFM) AFM with an inverted AFM (i-AFM) design were carried out. Conventional AFM requires a cantilever with an integrated tip to image a substrate-supported sample, whereas i-AFM, uses one of tens of thousands of substrate-supported tips to image a cantilever-supported sample. Microcontact printed and dip-pen nanolithographyically modified silicon chip and tipless cantilevers were characterized by both conventional and inverted AFM in contact mode (CM), TM, force volume (FV) and PFM.

ISBN: 9780494091371Subjects--Topical Terms:

1021807
Chemistry, General.

Adaptation of intermittent contact modes to inverted atomic force microscopy.
LDR:01809nmm 2200265 4500 001 1825002
005 20061201084503.5
008 130610s2005 eng d
020 $a 9780494091371
035 $a (UnM)AAIMR09137
035 $a AAIMR09137
040 $a UnM $c UnM
100 1 $a Chan, Sandra Suk Fung. $3 1914028
245 1 0 $a Adaptation of intermittent contact modes to inverted atomic force microscopy.
300 $a 104 p.
500 $a Source: Masters Abstracts International, Volume: 44-03, page: 1363.
502 $a Thesis (M.Sc.)--University of Alberta (Canada), 2005.
520 $a This work is aimed at evaluating the plausibility of using atomic force microcopy (AFM) instrumentation and techniques for the measurement of interaction force and surface characterization in a high throughput manner. Investigations of the feasibility of combining tapping mode (TM) AFM and pulsed-force mode (PFM) AFM with an inverted AFM (i-AFM) design were carried out. Conventional AFM requires a cantilever with an integrated tip to image a substrate-supported sample, whereas i-AFM, uses one of tens of thousands of substrate-supported tips to image a cantilever-supported sample. Microcontact printed and dip-pen nanolithographyically modified silicon chip and tipless cantilevers were characterized by both conventional and inverted AFM in contact mode (CM), TM, force volume (FV) and PFM.
520 $a We have demonstrated for the first time that iTM-AFM and iPFM-AFM are capable of differentiating chemical heterogeneity of a patterned surface by phase contrast and adhesive force measurement, respectively.
590 $a School code: 0351.
650 4 $a Chemistry, General. $3 1021807
650 4 $a Chemistry, Physical. $3 560527
690 $a 0485
690 $a 0494
710 2 0 $a University of Alberta (Canada). $3 626651
773 0 $t Masters Abstracts International $g 44-03.
790 $a 0351
791 $a M.Sc.
792 $a 2005
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=MR09137