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Field theoretic analysis of a class ...

Hahm, Yeon-Chang.

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Field theoretic analysis of a class of planar microwave and optoelectronic structures.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Field theoretic analysis of a class of planar microwave and optoelectronic structures./
Author:	Hahm, Yeon-Chang.
Description:	163 p.
Notes:	Source: Dissertation Abstracts International, Volume: 61-05, Section: B, page: 2678.
Contained By:	Dissertation Abstracts International61-05B.
Subject:	Engineering, Electronics and Electrical. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9973881
ISBN:	9780599792807

Field theoretic analysis of a class of planar microwave and optoelectronic structures.
Hahm, Yeon-Chang.

Field theoretic analysis of a class of planar microwave and optoelectronic structures. - 163 p.

Source: Dissertation Abstracts International, Volume: 61-05, Section: B, page: 2678.

Thesis (Ph.D.)--Oregon State University, 2000.

With increasing operating frequencies in CMOS RF/microwave integrated circuits, the performance of on-chip interconnects is becoming significantly affected by the lossy substrate. It is the purpose of the first part of this thesis to develop a rigorous field theoretic analysis approach for efficient characterization of single and multiple coupled interconnects on silicon substrate, which is applicable over a wide range of substrate resistivities. The frequency-dependent transmission line parameters of a microstrip on silicon are determined by a new formulation based on a quasi-electrostatic and quasi-magnetostatic spectral domain approach. It is demonstrated that this new quasi-static formulation provides the complete frequency-dependent interconnect characteristics for all three major transmission line modes of operation. In particular, it is shown that in the case of heavily doped CMOS substrates, the distributed series inductance and series resistance parameters are significantly affected by the presence of longitudinal substrate currents giving rise to the substrate skin-effect. The method is further extended to multiple coupled single and multi-level interconnect structures with ground plane and multiple coupled co-planar stripline structures without ground plane. The finite conductor thickness is taken into account in terms of a stacked conductor model. The new quasi-static approach is validated by comparison with results obtained with a full-wave spectral domain method and the commercial planar full-wave electromagnetic field solver HP/MomentumRTM, as well as published simulation and measurement data.

ISBN: 9780599792807Subjects--Topical Terms:

626636
Engineering, Electronics and Electrical.

Field theoretic analysis of a class of planar microwave and optoelectronic structures.
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100 1 $a Hahm, Yeon-Chang. $3 1913784
245 1 0 $a Field theoretic analysis of a class of planar microwave and optoelectronic structures.
300 $a 163 p.
500 $a Source: Dissertation Abstracts International, Volume: 61-05, Section: B, page: 2678.
500 $a Advisers: Vijai K. Tripathi; Andreas Weisshaar.
502 $a Thesis (Ph.D.)--Oregon State University, 2000.
520 $a With increasing operating frequencies in CMOS RF/microwave integrated circuits, the performance of on-chip interconnects is becoming significantly affected by the lossy substrate. It is the purpose of the first part of this thesis to develop a rigorous field theoretic analysis approach for efficient characterization of single and multiple coupled interconnects on silicon substrate, which is applicable over a wide range of substrate resistivities. The frequency-dependent transmission line parameters of a microstrip on silicon are determined by a new formulation based on a quasi-electrostatic and quasi-magnetostatic spectral domain approach. It is demonstrated that this new quasi-static formulation provides the complete frequency-dependent interconnect characteristics for all three major transmission line modes of operation. In particular, it is shown that in the case of heavily doped CMOS substrates, the distributed series inductance and series resistance parameters are significantly affected by the presence of longitudinal substrate currents giving rise to the substrate skin-effect. The method is further extended to multiple coupled single and multi-level interconnect structures with ground plane and multiple coupled co-planar stripline structures without ground plane. The finite conductor thickness is taken into account in terms of a stacked conductor model. The new quasi-static approach is validated by comparison with results obtained with a full-wave spectral domain method and the commercial planar full-wave electromagnetic field solver HP/MomentumRTM, as well as published simulation and measurement data.
520 $a In the second part of this thesis, coupled planar optical interconnect structures are investigated based on a rigorous field theoretic analysis combined with an application of the normal mode theory for coupled transmission lines. A new transfer matrix description for a general optical directional coupler is presented. Based on this transfer matrix formulation, the wavelength-dependent characteristics of multi-section optical filters consisting of cascaded asymmetric optical directional coupler sections are investigated. It is shown that by varying the asymmetry factors of the cascaded coupled waveguide sections, optical wavelength filters with different passband properties can be achieved.
590 $a School code: 0172.
650 4 $a Engineering, Electronics and Electrical. $3 626636
650 4 $a Physics, Electricity and Magnetism. $3 1019535
650 4 $a Physics, Optics. $3 1018756
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710 2 0 $a Oregon State University. $3 625720
773 0 $t Dissertation Abstracts International $g 61-05B.
790 1 0 $a Tripathi, Vijai K., $e advisor
790 1 0 $a Weisshaar, Andreas, $e advisor
790 $a 0172
791 $a Ph.D.
792 $a 2000
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9973881