東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Direct and converse measurements of ...

Yimnirun, Rattikorn.

FindBook

Google Book

Amazon

博客來

Direct and converse measurements of electrostriction in low permittivity dielectrics.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Direct and converse measurements of electrostriction in low permittivity dielectrics./
作者:	Yimnirun, Rattikorn.
面頁冊數:	342 p.
附註:	Source: Dissertation Abstracts International, Volume: 62-07, Section: B, page: 3345.
Contained By:	Dissertation Abstracts International62-07B.
標題:	Engineering, Materials Science. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3020553
ISBN:	049332478X

Direct and converse measurements of electrostriction in low permittivity dielectrics.
Yimnirun, Rattikorn.

Direct and converse measurements of electrostriction in low permittivity dielectrics. - 342 p.

Source: Dissertation Abstracts International, Volume: 62-07, Section: B, page: 3345.

Thesis (Ph.D.)--The Pennsylvania State University, 2001.

Electrostriction is the basic electromechanical coupling mechanism in all insulators. For most low permittivity dielectrics, the electrostrictive effects are extremely small, and are often obscured by other phenomena, making them difficult to measure.

ISBN: 049332478XSubjects--Topical Terms:

1017759
Engineering, Materials Science.

Direct and converse measurements of electrostriction in low permittivity dielectrics.
LDR:03389nmm 2200325 4500 001 1818963
005 20060920092645.5
008 130610s2001 eng d
020 $a 049332478X
035 $a (UnM)AAI3020553
035 $a AAI3020553
040 $a UnM $c UnM
100 1 $a Yimnirun, Rattikorn. $3 1908266
245 1 0 $a Direct and converse measurements of electrostriction in low permittivity dielectrics.
300 $a 342 p.
500 $a Source: Dissertation Abstracts International, Volume: 62-07, Section: B, page: 3345.
500 $a Adviser: Robert E. Newnham.
502 $a Thesis (Ph.D.)--The Pennsylvania State University, 2001.
520 $a Electrostriction is the basic electromechanical coupling mechanism in all insulators. For most low permittivity dielectrics, the electrostrictive effects are extremely small, and are often obscured by other phenomena, making them difficult to measure.
520 $a This study presents electrostriction measurements on low permittivity single crystals, ceramics, glasses, glass-ceramics, and polymers by two independent techniques. A single-beam interferometer with the capability of resolving 10-4 A in the field-induced displacement was used for the direct coefficient measurements. For the converse technique, a dynamic compressometer was constructed to measure stress-induced changes in capacitance as small as 10-17 F. Problems associated with the measurements, along with procedures designed to eliminate or minimize these problems were discussed. To obtain the true electrostrictive coefficients, Maxwell stress and thermal stress corrections are required for the direct method, while a stress-induced geometric correction must be accounted for in the converse measurement. These corrections are found to be very significant in low permittivity dielectrics. Nevertheless, the results from the two methods are, with a few exceptions, in fairly good agreement.
520 $a This study presents for the first time the electrostrictive coefficients of several important electronic packaging materials including Al2O 3, BeO, MgO, silica glass, and other engineering glass-ceramics and polymers. Most of the low permittivity dielectrics studied have electrostrictive M coefficients between 10-23 to 10-21 m2/V2, far smaller than the M coefficients of 10-16 m2/V2 in relaxor ferroelectrics and 10-18 m2/V2 in very compliant polymers such as polyurethane. All the materials studied exhibit positive longitudinal coefficients, while the transverse coefficients can be either positive or negative. In units of 10-21 m2/V2, the M11 coefficients of common engineering polymers ranged from +0.4 in polystyrene to +12.7 in polypropylene, and for single crystals from +0.66 in CaF2 to +5.81 in LiF. In oxide ceramics and glasses M11 coefficients ranged from +0.06 in fused-SiO2 to +0.67 in MgO.
520 $a Finally, an effective way of predicting the magnitude of electrostriction in insulators is proposed based on the observed linear relationship between the electrostrictive coefficients and the product of elastic compliance and dielectric permittivity.
590 $a School code: 0176.
650 4 $a Engineering, Materials Science. $3 1017759
650 4 $a Physics, Condensed Matter. $3 1018743
650 4 $a Physics, Electricity and Magnetism. $3 1019535
690 $a 0794
690 $a 0611
690 $a 0607
710 2 0 $a The Pennsylvania State University. $3 699896
773 0 $t Dissertation Abstracts International $g 62-07B.
790 1 0 $a Newnham, Robert E., $e advisor
790 $a 0176
791 $a Ph.D.
792 $a 2001
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3020553