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Bulge and blister testing of thin fi...

Hohlfelder, Robert James.

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Bulge and blister testing of thin films and their interfaces.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Bulge and blister testing of thin films and their interfaces./
Author:	Hohlfelder, Robert James.
Description:	168 p.
Notes:	Source: Dissertation Abstracts International, Volume: 60-04, Section: B, page: 1797.
Contained By:	Dissertation Abstracts International60-04B.
Subject:	Engineering, Materials Science. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9924567
ISBN:	0599241373

Bulge and blister testing of thin films and their interfaces.
Hohlfelder, Robert James.

Bulge and blister testing of thin films and their interfaces. - 168 p.

Source: Dissertation Abstracts International, Volume: 60-04, Section: B, page: 1797.

Thesis (Ph.D.)--Stanford University, 1999.

The aim of this work is to refine the understanding and application of the bulge and blister techniques, which are useful for studying mechanical properties and adhesion of thin-film materials. In the bulge experiment, the deflection of a pressurized, free-standing thin film window is analyzed to determine the film's mechanical properties. We perform a thorough analysis of the deflection of linearly elastic, membrane-like windows, treating both residual strain and the strain resulting from out-of-plane stretching. Comparing solutions from various sources, we establish a generalized equation relating a window's deflection to its dimensions, mechanical properties, and the applied pressure. We analyze bending stresses near the window edge, and establish techniques for studying plasticity using the bulge technique.

ISBN: 0599241373Subjects--Topical Terms:

1017759
Engineering, Materials Science.

Bulge and blister testing of thin films and their interfaces.
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008 130610s1999 eng d
020 $a 0599241373
035 $a (UnM)AAI9924567
035 $a AAI9924567
040 $a UnM $c UnM
100 1 $a Hohlfelder, Robert James. $3 1904653
245 1 0 $a Bulge and blister testing of thin films and their interfaces.
300 $a 168 p.
500 $a Source: Dissertation Abstracts International, Volume: 60-04, Section: B, page: 1797.
500 $a Adviser: William D. Nix.
502 $a Thesis (Ph.D.)--Stanford University, 1999.
520 $a The aim of this work is to refine the understanding and application of the bulge and blister techniques, which are useful for studying mechanical properties and adhesion of thin-film materials. In the bulge experiment, the deflection of a pressurized, free-standing thin film window is analyzed to determine the film's mechanical properties. We perform a thorough analysis of the deflection of linearly elastic, membrane-like windows, treating both residual strain and the strain resulting from out-of-plane stretching. Comparing solutions from various sources, we establish a generalized equation relating a window's deflection to its dimensions, mechanical properties, and the applied pressure. We analyze bending stresses near the window edge, and establish techniques for studying plasticity using the bulge technique.
520 $a In the related blister technique, pressure is increased until the film debonds from its substrate, forming a circular "blister" which grows stably. The energy expended debonding the film, which provides a measurement of adhesion, can be determined from measurements of pressure and deflection. We derive a generalized relation for the energy release rate, and analyze the mode mixity generated by the experiment.
520 $a The design of a blister test apparatus is described, with emphasis placed on the construction of a stiff system which permits stable blister growth and accurate measurement of blister volume. We describe techniques for fabricating free-standing windows. Sources of error in bulge test results are examined, and techniques for analyzing and interpreting experimental data described.
590 $a School code: 0212.
650 4 $a Engineering, Materials Science. $3 1017759
650 4 $a Applied Mechanics. $3 1018410
690 $a 0794
690 $a 0346
710 2 0 $a Stanford University. $3 754827
773 0 $t Dissertation Abstracts International $g 60-04B.
790 1 0 $a Nix, William D., $e advisor
790 $a 0212
791 $a Ph.D.
792 $a 1999
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9924567