Language:
English
繁體中文
Help
回圖書館首頁
手機版館藏查詢
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Time-resolved tapping-mode atomic fo...
~
Sarioglu, Ali Fatih.
Linked to FindBook
Google Book
Amazon
博客來
Time-resolved tapping-mode atomic force microscopy.
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Time-resolved tapping-mode atomic force microscopy./
Author:
Sarioglu, Ali Fatih.
Description:
164 p.
Notes:
Source: Dissertation Abstracts International, Volume: 71-01, Section: B, page: 0555.
Contained By:
Dissertation Abstracts International71-01B.
Subject:
Applied Mechanics. -
Online resource:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3395854
ISBN:
9781109585094
Time-resolved tapping-mode atomic force microscopy.
Sarioglu, Ali Fatih.
Time-resolved tapping-mode atomic force microscopy.
- 164 p.
Source: Dissertation Abstracts International, Volume: 71-01, Section: B, page: 0555.
Thesis (Ph.D.)--Stanford University, 2010.
There is an increasing interest in the use of atomic force microscopy for quantitative mapping of material-specific surface properties. Unfortunately, methods that have been developed for local stiffness measurements suffer from low operational speeds and they apply large forces to the surface, limiting their resolution and use on soft materials such as polymers and biological samples. On the other hand, tapping-mode AFM, which is well suited to soft materials due to its gentle interaction with the surface, cannot be used to recover information on the tip-sample interaction (and hence, on the material properties) due to limited mechanical bandwidth offered by the resonant AFM probe.
ISBN: 9781109585094Subjects--Topical Terms:
1018410
Applied Mechanics.
Time-resolved tapping-mode atomic force microscopy.
LDR
:02407nam 2200277 4500
001
1403129
005
20111111141806.5
008
130515s2010 ||||||||||||||||| ||eng d
020
$a
9781109585094
035
$a
(UMI)AAI3395854
035
$a
AAI3395854
040
$a
UMI
$c
UMI
100
1
$a
Sarioglu, Ali Fatih.
$3
1682376
245
1 0
$a
Time-resolved tapping-mode atomic force microscopy.
300
$a
164 p.
500
$a
Source: Dissertation Abstracts International, Volume: 71-01, Section: B, page: 0555.
502
$a
Thesis (Ph.D.)--Stanford University, 2010.
520
$a
There is an increasing interest in the use of atomic force microscopy for quantitative mapping of material-specific surface properties. Unfortunately, methods that have been developed for local stiffness measurements suffer from low operational speeds and they apply large forces to the surface, limiting their resolution and use on soft materials such as polymers and biological samples. On the other hand, tapping-mode AFM, which is well suited to soft materials due to its gentle interaction with the surface, cannot be used to recover information on the tip-sample interaction (and hence, on the material properties) due to limited mechanical bandwidth offered by the resonant AFM probe.
520
$a
In this work, a technique for rapid quantitative material characterization with nanoscale spatial resolution is introduced. This technique is based on time-resolved measurement of tip-sample interaction forces during tapping-mode AFM imaging by a special micromachined AFM probe. In this probe, a high-bandwidth interferometric force sensor at the end of the cantilever is coupled to the tip motion and is used to resolve tip-sample interaction forces with high sensitivity and temporal resolution. Combined with a real-time signal processing software that we developed, these probes provide quantitative maps of peak interaction forces and elastic properties simultaneously with conventional AFM data. High-contrast compositional mapping, peak force imaging and quantitative material characterization by mapping surface Young's modulus acquired using this technique are demonstrated on various samples.
590
$a
School code: 0212.
650
4
$a
Applied Mechanics.
$3
1018410
650
4
$a
Engineering, Electronics and Electrical.
$3
626636
650
4
$a
Engineering, Materials Science.
$3
1017759
690
$a
0346
690
$a
0544
690
$a
0794
710
2
$a
Stanford University.
$3
754827
773
0
$t
Dissertation Abstracts International
$g
71-01B.
790
$a
0212
791
$a
Ph.D.
792
$a
2010
856
4 0
$u
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3395854
based on 0 review(s)
Location:
ALL
電子資源
Year:
Volume Number:
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
Item Class
Material type
Call number
Usage Class
Loan Status
No. of reservations
Opac note
Attachments
W9166268
電子資源
11.線上閱覽_V
電子書
EB
一般使用(Normal)
On shelf
0
1 records • Pages 1 •
1
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login