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Characteristics and applications of ...
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George, Anoop.
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Characteristics and applications of a scanning nano-slit optical sensor.
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Characteristics and applications of a scanning nano-slit optical sensor./
作者:
George, Anoop.
面頁冊數:
159 p.
附註:
Source: Dissertation Abstracts International, Volume: 72-04, Section: B, page: .
Contained By:
Dissertation Abstracts International72-04B.
標題:
Engineering, General. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3443655
ISBN:
9781124489520
Characteristics and applications of a scanning nano-slit optical sensor.
George, Anoop.
Characteristics and applications of a scanning nano-slit optical sensor.
- 159 p.
Source: Dissertation Abstracts International, Volume: 72-04, Section: B, page: .
Thesis (Ph.D.)--The University of Arizona, 2011.
In this dissertation, imaging characteristics of a nano-slit are investigated. Applications of a scanning and rotating nano-slit in measuring sub-micron aerial features are demonstrated. Coherent sub-micron spot distributions are reconstructed with a very high contrast. Finally, high NA partially coherent images with features as small as 210 nm half-pitch are reconstructed and the ultimate resolution of the system is determined.
ISBN: 9781124489520Subjects--Topical Terms:
1020744
Engineering, General.
Characteristics and applications of a scanning nano-slit optical sensor.
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In this dissertation, imaging characteristics of a nano-slit are investigated. Applications of a scanning and rotating nano-slit in measuring sub-micron aerial features are demonstrated. Coherent sub-micron spot distributions are reconstructed with a very high contrast. Finally, high NA partially coherent images with features as small as 210 nm half-pitch are reconstructed and the ultimate resolution of the system is determined.
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A nano-slit is characterized as a sensor for coherent line-and-space features. Experiments and simulation verify image detection with contrasts greater than 0.9. Effects of polarization on imaging performance are reported. A scanning and rotating nano-slit in conjunction with a filtered back-projection technique is used to reconstruct sub-micron coherent spot distributions. Simulation results show very good agreement with the experiment. Further, it is shown that the reconstruction is very resilient to some common random experimental errors.
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Imaging characteristics of a scanning nano-slit sensor are determined for high NA partially coherent images. Good imaging performance (contrast > 0.8) is demonstrated with line-and-space images up to a spatial frequency of 2.38 lp / mum. Sub-micron features in a high NA partially coherent image are measured with a scanning and rotating nano-slit. A modified microscope is used to create the measured features, including 210 nm half-pitch features that cannot be imaged using the microscope in a conventional imaging mode. Using the filtered back projection technique, two-dimensional sub-micron features are reconstructed by the nano-slit sensor. It is determined that the resolution limit of ∼200 nm is determined by the reconstruction technique and not by the width of the nano-slit.
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http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3443655
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