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Statistical performance analysis and...
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Shen, Ruijing.{me_controlnum}
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Statistical performance analysis and modeling techniques for nanometer VLSI designs
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Statistical performance analysis and modeling techniques for nanometer VLSI designs/ by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu.
作者:
Shen, Ruijing.{me_controlnum}
其他作者:
Tan, Sheldon X.-D.
出版者:
Boston, MA :Springer US, : 2012.,
面頁冊數:
xxix, 305 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
標題:
Integrated circuits - Very large scale integration -
電子資源:
http://dx.doi.org/10.1007/978-1-4614-0788-1
ISBN:
9781461407881 (electronic bk.)
Statistical performance analysis and modeling techniques for nanometer VLSI designs
Shen, Ruijing.{me_controlnum}
Statistical performance analysis and modeling techniques for nanometer VLSI designs
[electronic resource] /by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu. - Boston, MA :Springer US,2012. - xxix, 305 p. :ill., digital ;24 cm.
ISBN: 9781461407881 (electronic bk.)Subjects--Topical Terms:
715562
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75 / .S54 2012
Dewey Class. No.: 621.395
Statistical performance analysis and modeling techniques for nanometer VLSI designs
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