東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Applications of finite element metho...

Tan, Cher Ming.

FindBook

Google Book

Amazon

博客來

Applications of finite element methods for reliability studies on ULSI interconnections

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Applications of finite element methods for reliability studies on ULSI interconnections/ by Cher Ming Tan ... [et al.].{me_controlnum}
其他作者:	Tan, Cher Ming.
出版者:	London :Springer-Verlag London Limited, : 2011.,
面頁冊數:	vii, 150 p. :ill., digital ;24 cm.
叢書名:	Springer series in reliability engineering,
Contained By:	Springer eBooks
標題:	Integrated circuits - Ultra large scale integration. -
電子資源:	http://dx.doi.org/10.1007/978-0-85729-310-7
ISBN:	9780857293107 (electronic bk.)

Applications of finite element methods for reliability studies on ULSI interconnections
Applications of finite element methods for reliability studies on ULSI interconnections[electronic resource] /by Cher Ming Tan ... [et al.].{me_controlnum} - London :Springer-Verlag London Limited,2011. - vii, 150 p. :ill., digital ;24 cm. - Springer series in reliability engineering,1614-7839.

ISBN: 9780857293107 (electronic bk.)Subjects--Topical Terms:

737745
Integrated circuits
--Ultra large scale integration.

LC Class. No.: TK7874.76 / .A67 2011

Dewey Class. No.: 621.395

Applications of finite element methods for reliability studies on ULSI interconnections
LDR:00880nmm 2200241 a 4500 001 1265829
003 Springer
005 20110804170603.0
006 m d
007 cr nn 008maaau
008 120817s2011 enk s j eng d
020 $a 9780857293107 (electronic bk.)
020 $a 9780857293091 (paper)
035 $a 978-0-85729-309-1
050 0 4 $a TK7874.76 $b .A67 2011
082 0 4 $a 621.395 $2 22
090 $a TK7874.76 $b .A652 2011
245 0 0 $a Applications of finite element methods for reliability studies on ULSI interconnections $h [electronic resource] / $c by Cher Ming Tan ... [et al.].{me_controlnum}
260 $a London : $b Springer-Verlag London Limited, $c 2011.
300 $a vii, 150 p. : $b ill., digital ; $c 24 cm.
440 0 $a Springer series in reliability engineering, $x 1614-7839
650 0 $a Integrated circuits $x Ultra large scale integration. $3 737745
650 0 $a Finite element method. $3 579714
650 0 $a Reliability (Engineering) $x Mathematical models. $3 536961
650 1 4 $a Engineering. $3 586835
650 2 4 $a Quality Control, Reliability, Safety and Risk. $3 891027
650 2 4 $a Computational Intelligence. $3 1001631
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 893838
650 2 4 $a Optical and Electronic Materials. $3 891120
650 2 4 $a Partial Differential Equations. $3 890899
700 1 $a Tan, Cher Ming. $3 1533233
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-0-85729-310-7
950 $a Engineering (Springer-11647)