Languages
Lu, Toh-Ming.
Overview
| Works: | 1 works in 3 publications in 1 languages | |
|---|---|---|
Titles
Evolution of Thin Film Morphology = Modeling and Simulations /
by:
Lu, Toh-Ming.; SpringerLink (Online service); Pelliccione, Matthew.
(Language materials, printed)
Dielectric breakdown in gigascale electronics = time dependent failure mechanisms /
by:
Lu, Toh-Ming.; SpringerLink (Online service); Plawsky, Joel.; Borja, Juan Pablo.
(Electronic resources)
Metal-dielectric interfaces in gigascale electronics = thermal and electrical stability /
by:
He, Ming.{me_controlnum}; Lu, Toh-Ming.; SpringerLink (Online service)
(Electronic resources)
Rheed transmission mode and pole figures = thin film and nanostructure texture analysis /
by:
Wang, Gwo-Ching.; Lu, Toh-Ming.; SpringerLink (Online service)
(Electronic resources)
Subjects
Chemistry.
Thin films- Microstructure.
Tribology, Corrosion and Coatings.
Crystal growth.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Electronics and Microelectronics, Instrumentation.
Thin films- Mathematical models.
Interfaces (Physical sciences)
Molecular beams.
Electrochemistry.
Materials Science.
Microelectronics- Materials.
Nanotechnology and Microengineering.
Optical and Electronic Materials.
Engineering.
Engineering Thermodynamics, Heat and Mass Transfer.
Characterization and Evaluation of Materials.
Surface and Interface Science, Thin Films.
Electronic Circuits and Devices.