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Noia, Brandon.

Overview
Works: 0 works in 1 publications in 1 languages
Titles
Design-for-test and test optimization techniques for TSV-based 3D stacked ICs by: Noia, Brandon.; Chakrabarty, Krishnendu.; SpringerLink (Online service) (Electronic resources)
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. by: Noia, Brandon.; Duke University., Electrical and Computer Engineering. (Electronic resources)
 
 
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