Languages
Sadewasser, Sascha.
Overview
| Works: | 0 works in 2 publications in 1 languages | |
|---|---|---|
Titles
Kelvin probe force microscopy = measuring and compensating electrostatic forces /
by:
Sadewasser, Sascha.; Glatzel, Thilo.; SpringerLink (Online service)
(Electronic resources)
Kelvin probe force microscopy = from single charge detection to device characterization /
by:
Sadewasser, Sascha.; Glatzel, Thilo.; SpringerLink (Online service)
(Electronic resources)
Subjects
Electrostatics- Measurement.
Surfaces and Interfaces, Thin Films.
Thermodynamics.
Spectroscopy and Microscopy.
Atomic force microscopy.
Materials Science.
Measurement Science and Instrumentation.
Nanotechnology and Microengineering.
Engineering Thermodynamics, Heat and Mass Transfer.
Scanning probe microscopy.
Physics.
Characterization and Evaluation of Materials.