Ahmed, Nisar.
Overview
| Works: | 1 works in 0 publications in 0 languages | |
|---|---|---|
Titles
High quality delay tests for very deep submicron designs.
by:
Ahmed, Nisar.; University of Connecticut.
(Language materials, printed)
Nanometer technology designs = high-quality delay tests /
by:
Ahmed, Nisar.; SpringerLink (Online service); Tehranipoor, Mohammad.
(Language materials, printed)
Subjects
Nanotechnology.
Electronics and Microelectronics, Instrumentation.
Integrated circuits- Testing.
Integrated circuits- Very large scale integration.
Computer-Aided Engineering (CAD, CAE) and Design.
Circuits and Systems.
Nanoelectronics.
Engineering.
Electrical Engineering.
Engineering, Electronics and Electrical.