張仁平

發明專利實體審查基準 / . (二)Substantive examination guidelines for invention patent(二) by: 張仁平 (書目-語言資料,印刷品)

發明專利實體審查基準 = = Guidelines for substantive examination of invention patent / by: 張仁平 (書目-語言資料,印刷品)

發明專利實體審查基準 = = Guidelines for substantive examination of invention patent(一) : compilation of international regulations and case studies : 國際法規與案彙編 / . (一) by: 張仁平; 謝銘洋 (書目-語言資料,印刷品)