Ahmed, Nisar.
概要
| 作品: | 1 作品在 0 項出版品 0 種語言 | |
|---|---|---|
書目資訊
High quality delay tests for very deep submicron designs.
by:
Ahmed, Nisar.; University of Connecticut.
(書目-語言資料,印刷品)
Nanometer technology designs = high-quality delay tests /
by:
Ahmed, Nisar.; SpringerLink (Online service); Tehranipoor, Mohammad.
(書目-語言資料,印刷品)
主題
Nanotechnology.
Electronics and Microelectronics, Instrumentation.
Integrated circuits- Testing.
Integrated circuits- Very large scale integration.
Computer-Aided Engineering (CAD, CAE) and Design.
Circuits and Systems.
Nanoelectronics.
Engineering.
Electrical Engineering.
Engineering, Electronics and Electrical.