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Essentials of electronic testing for...

Agrawal, Vishwani D., (1943-.)

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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits // Michael L. Bushnell, Vishwani D. Agrawal.
Author:	Bushnell, Michael L.
other author:	Agrawal, Vishwani D.,
Published:	Boston :Kluwer Academic, : c2000.,
Description:	xviii, 690 p. :ill. ;26 cm.
Series:	Frontiers in electronic testing ;
Subject:	Digital integrated circuits - Testing. -
ISBN:	0792379918 :

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
Bushnell, Michael L.1950-.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /Michael L. Bushnell, Vishwani D. Agrawal. - Boston :Kluwer Academic,c2000. - xviii, 690 p. :ill. ;26 cm. - Frontiers in electronic testing ;17..

Includes bibliographical references (p. [631]-670) and index.

ISBN: 0792379918 :EUR154.50

LCCN: 00046212Subjects--Topical Terms:

752574
Digital integrated circuits
--Testing.

LC Class. No.: TK7874.75 / .B87 2000

Dewey Class. No.: 621.39/5

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
LDR:00650pam a2200181 a 45 001 699519
005 20060113
008 060112s2000 maua b 001 0 eng
010 $a 00046212
020 $a 0792379918 : $c EUR154.50
035 $a CE94T0057
040 $a DLC $c DLC $d DLC
050 0 0 $a TK7874.75 $b .B87 2000
082 0 0 $a 621.39/5 $2 21
100 $a Bushnell, Michael L. $q (Michael Lee), $d 1950-. $3 752573
245 1 0 $a Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / $c Michael L. Bushnell, Vishwani D. Agrawal.
260 $a Boston : $c c2000. $b Kluwer Academic,
300 $a xviii, 690 p. : $b ill. ; $c 26 cm.
440 0 $a Frontiers in electronic testing ; $v 17.
504 $a Includes bibliographical references (p. [631]-670) and index.
650 $a Digital integrated circuits $x Testing. $3 752574
650 $a Integrated circuits $x Very large scale integration $x Testing. $3 629092
650 $a Mixed signal circuits $x Testing. $3 752575
650 $a Semiconductor storage devices $x Testing. $3 752576
700 $a Agrawal, Vishwani D., $d 1943-. $3 752572